|
[1]
|
F. Tsung and D. W. Apley, “The dynamic T2 chart for monitoring feedback-controlled processes,” IIE Transac-tion, Vol. 34, pp. 1043–1053, 2002.
|
|
[2]
|
X. H. Wang, G. P. Han, and Q. Q. Li, “A joint-monitor-ing method of process disturbance under an integrated SPC/EPC model,” Proceedings of the 38th international conference on computers and industrial engineering, Zhengzhou, 2008.
|
|
[3]
|
C. H. Huang and Y. N. Lin, “Decision rule of assignable causes removal under an SPC/EPC integration system,” International journal of systems science, Vol. 33, No. 10, pp. 855–867, 2002.
|
|
[4]
|
D. W. Apley and F. Tsung, “The autoregressive T2 chart for monitoring univariate autocorrelated processes,” Journal of Quality Technology, Vol. 34, No. 1, pp. 79–95, 2002.
|
|
[5]
|
F. Tsung, “Run to run proportional integral derivative process control and monitoring schemes,” A dissertation submitted in partial fulfillment of the requirements for degree of Doctor of Philosophy, University of Michigan, pp. 121–123, 1997.
|
|
[6]
|
G. Box and T. Kramer, “Statistical process monitoring and feedback adjustment-a discussion,” American statis-tical Association and the American Society for Quality Control, Journal Technometrics, Vol. 34, No. 3, pp. 251–267, 1992.
|
|
[7]
|
F. B. Alt, “Multivariate quality control,” in Encyclopedia of the statistical Science, eds. N. L. Johnson, S. Kotz and C. R. Read, New York, John Wiley, pp. 111–122.
|
|
[8]
|
D. C. Montgomery, J. B. Keats, G. Runger and W. Messina, “Integrating statistical process control and en-gineering process control,” Journal Quality Technology, Vol. 26, No. 2, pp. 79–87, 1994.
|
|
[9]
|
H. Hotelling, “Multivariate quality control-illustrated by air testing of sample bombsights,” Techniques of Statis-tical Analysis, Mcgraw-Hill, New York, pp. 11–184, 1947.
|
|
[10]
|
B. Cheng and D. M. Titterington, “Neural networks: A review from a statistical perspective,” Statistical Science, Vol. 9, pp. 2–54, 1994.
|
|
[11]
|
G. D. Feng and C. Chen, “Nonlinear inversion of poten-tial-field data using an improved genetic algorithm,” Journal of China University of Geosciences, Vol. 15, No. 4, pp. 25–31, 2004.
|
|
[12]
|
C. C. CHIU, “Identification of process disturbance using SPC/EPC and neural networks,” Journal of intelligent manufacturing, Vol. 14, pp. 379–388, 2003.
|
|
[13]
|
J. Neter, W. Wasserman, and G. A. Whitmore, Applied Statistics, Boston, Allyn and Bacon, 1979.
|