Fatiha Besahraoui, Larbi Chahed, Yahia Bouizem, Jamal Dine Sib
Laboratory of Physics of Thin Films and Materials for Electronics, University of Oran Es-Senia, Oran, Algeria.
DOI: 10.4236/wjnse.2012.21001   PDF    HTML     4,460 Downloads   7,928 Views   Citations

Abstract

The enhanced optical absorption measured by Constant Photocurrent Method (CPM) of hydrogenated nanocrystalline silicon thin films is due mainly to bulk and/or surface light scattering effects. A new numerical method is presented to calculate both true optical absorption and scattering coefficient from CPM absorption spectra of nanotextured nano-crystalline silicon films. Bulk and surface light scattering contributions can be unified through the correlation obtained between the scattering coefficient and surface roughness obtained using our method.

Keywords

Solution Hydrogenated Nanocrystalline Silicon; Constant Photocurrent Method; Optical Absorption; Bulk Light Scattering; Surface Roughness; Film Thickness

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Conflicts of Interest

The authors declare no conflicts of interest.

References

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