TITLE:
Systematic Errors Introduced into Sorghum Grain Yield Data: Does the Multiseed (msd) Trait Increase Sorghum Seed Yield?
AUTHORS:
Dennis C. Gitz III, Jeffrey T. Baker, Zhanguo Xin, John E. Stout, Robert J. Lascano
KEYWORDS:
Sorghum, Yield, Yield Components, msd, Multiseed, Yield Measurement, Error
JOURNAL NAME:
American Journal of Plant Sciences,
Vol.10 No.9,
September
9,
2019
ABSTRACT: Multiseed (msd)
mutant sorghum [Sorghum bicolor (L.)
Moench] lines with greatly increased seed numbers were developed. It was
originally thought that the msd trait
could increase grain yield several times in comparison with the wild type from
which the mutant was derived. However, in a small plot trial, msd seed yield decreased when compared
to the parent line. Herein we report results that msd seed yield remained either unchanged or slightly increased in
comparison to the parent line. We suggest that attempts to measure msd sorghum seed yield were complicated
due to systematic errors associated with the post-harvest processing methods,
including threshing and pneumatic winnowing equipment that was used for
harvest. That is, seed recovery and seed
loss from individual panicles were affected by the post-harvest
processing. When evaluating sorghum grain yield of types with
different seed sizes, threshing and seed cleaning harvesting methods should be
optimized for each sorghum line.