default search action
Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCIDIEEE Transactions on Reliability, Volume 65
Volume 65, Number 1, March 2016
- W. Eric Wong:
Special Section on Software Quality Assurance: Research and Practice. 3 - Erik Rogstad, Lionel C. Briand:
Clustering Deviations for Black Box Regression Testing of Database Applications. 4-18 - Qingkai Shi
, Zhenyu Chen, Chunrong Fang, Yang Feng, Baowen Xu:
Measuring the Diversity of a Test Set With Distance Entropy. 19-27 - Jianlong Xu, Zibin Zheng, Michael R. Lyu:
Web Service Personalized Quality of Service Prediction via Reputation-Based Matrix Factorization. 28-37 - Wangshu Liu, Shulong Liu, Qing Gu, Jiaqiang Chen, Xiang Chen, Daoxu Chen:
Empirical Studies of a Two-Stage Data Preprocessing Approach for Software Fault Prediction. 38-53 - Iberia Medeiros, Nuno Ferreira Neves, Miguel Correia:
Detecting and Removing Web Application Vulnerabilities with Static Analysis and Data Mining. 54-69 - Michael Grottke, Dong Seong Kim, Rajesh K. Mansharamani, Manoj Nambiar, Roberto Natella, Kishor S. Trivedi:
Recovery From Software Failures Caused by Mandelbugs. 70-87 - Mo Li, Shaoying Liu:
Integrating Animation-Based Inspection Into Formal Design Specification Construction for Reliable Software Systems. 88-106 - Radu Calinescu, Carlo Ghezzi, Kenneth Johnson, Mauro Pezzè, Yasmin Rafiq, Giordano Tamburrelli:
Formal Verification With Confidence Intervals to Establish Quality of Service Properties of Software Systems. 107-125 - Yingjun Deng, Anne Barros, Antoine Grall:
Degradation Modeling Based on a Time-Dependent Ornstein-Uhlenbeck Process and Residual Useful Lifetime Estimation. 126-140 - Serkan Eryilmaz:
Discrete Time Shock Models in a Markovian Environment. 141-146 - Christian Paroissin:
Inference for the Wiener Process With Random Initiation Time. 147-157 - Saralees Nadarajah:
A Comment on the Beta Hazard Rate Distribution. 158 - Serkan Eryilmaz:
Computing Barlow-Proschan Importance in Combined Systems. 159-163 - Xiaojun Zhu, Narayanaswamy Balakrishnan:
Exact Inference for Laplace Quantile, Reliability, and Cumulative Hazard Functions Based on Type-II Censored Data. 164-178 - Narayanaswamy Balakrishnan, William Volterman:
Exact Nonparametric Inference for Component and System Lifetime Distributions Based on Joint Signatures. 179-186 - Ji Hwan Cha, Maxim Finkelstein:
Optimal Long-Run Imperfect Maintenance With Asymptotic Virtual Age. 187-196 - Xufeng Zhao, Khalifa N. Al-Khalifa, Abdel Magid S. Hamouda, Toshio Nakagawa:
First and Last Triggering Event Approaches for Replacement With Minimal Repairs. 197-207 - Xujie Jia, Jingyuan Shen, Rui Xing:
Reliability Analysis for Repairable Multistate Two-Unit Series Systems When Repair Time Can Be Neglected. 208-216 - Hai Canh Vu, Phuc Do, Anne Barros:
A Stationary Grouping Maintenance Strategy Using Mean Residual Life and the Birnbaum Importance Measure for Complex Structures. 217-234 - Ping Li, Wenbin Wang, Rui Peng:
Age-Based Replacement Policy With Consideration of Production Wait Time. 235-247 - Yankang Du, Shuming Chen:
A Novel Layout-Based Single Event Transient Injection Approach to Evaluate the Soft Error Rate of Large Combinational Circuits in Complimentary Metal-Oxide-Semiconductor Bulk Technology. 248-255 - Yi-Jun Lu, Ziquan Guo, Tien-Mo Shih, Yulin Gao, Wei-Lin Huang, Hong-Li Lu, Yue Lin, Zhong Chen:
Optical Degradation Mechanisms of Indium Gallium Nitride-Based White Light Emitting Diodes by High-Temperature Aging Tests. 256-262 - Seong-Joon Kim, Tao Yuan, Suk Joo Bae:
A Spatio-Temporal Defect Process Model for Competing Progressive Breakdown Modes of Ultra-Thin Gate Oxides. 263-271 - Rossella Berni, Marcantonio Catelani, Caterina Fiesoli, Valeria L. Scarano:
A Comparison of Alloy-Surface Finish Combinations Considering Different Component Package Types and Their Impact on Soldering Reliability. 272-281 - Marija Mihova, Natasha Stojkovikj, Mile Jovanov, Emil Stankov:
Maximal Level Minimal Path Vectors of a Two-Terminal Undirected Network. 282-290 - Nishchal K. Verma, Rahul Kumar Sevakula, Sonal Dixit, Al Salour:
Intelligent Condition Based Monitoring Using Acoustic Signals for Air Compressors. 291-309 - Xin Xu, Zhiguo Li, Nan Chen:
A Hierarchical Model for Lithium-Ion Battery Degradation Prediction. 310-325 - João Paulo Pordeus Gomes, Roberto Kawakami Harrop Galvão, Takashi Yoneyama, Bruno P. Leao:
A New Degradation Indicator Based on a Statistical Anomaly Approach. 326-335 - Marine Jouin, Rafael Gouriveau, Daniel Hissel, Marie-Cécile Péra, Noureddine Zerhouni:
Joint Particle Filters Prognostics for Proton Exchange Membrane Fuel Cell Power Prediction at Constant Current Solicitation. 336-349 - Robert Mitchell, Ing-Ray Chen:
Modeling and Analysis of Attacks and Counter Defense Mechanisms for Cyber Physical Systems. 350-358 - Mahdi Tavangar:
Conditional Inactivity Time of Components in a Coherent Operating System. 359-369 - Mustafa Nadar, Fatih Kizilaslan:
Estimation of Reliability in a Multicomponent Stress-Strength Model Based on a Marshall-Olkin Bivariate Weibull Distribution. 370-380 - Gregory Levitin, Liudong Xing, Amir Ehsani Zonouz, Yuanshun Dai:
Heterogeneous Warm Standby Multi-Phase Systems With Variable Mission Time. 381-393 - Gregory Levitin, Liudong Xing, Yuanshun Dai:
Heterogeneous Non-Repairable Warm Standby Systems With Periodic Inspections. 394-409 - Radislav Vaisman, Dirk P. Kroese, Ilya B. Gertsbakh:
Improved Sampling Plans for Combinatorial Invariants of Coherent Systems. 410-424 - Gaofeng Da, Weiyong Ding:
Component Level Versus System Level k-Out-of-n Assembly Systems. 425-433 - Majid Chahkandi, Fabrizio Ruggeri, Alfonso Suárez-Llorens:
A Generalized Signature of Repairable Coherent Systems. 434-445 - Man Ho Ling, Hon Yiu So, Narayanaswamy Balakrishnan:
Likelihood Inference Under Proportional Hazards Model for One-Shot Device Testing. 446-458 - Tzong-Ru Tsai, Wen-Yun Sung, Yuhlong Lio, Shing I. Chang, Jye-Chyi Lu:
Optimal Two-Variable Accelerated Degradation Test Plan for Gamma Degradation Processes. 459-468 - Narayanaswamy Balakrishnan, Hon Yiu So, Man Ho Ling:
A Bayesian Approach for One-Shot Device Testing With Exponential Lifetimes Under Competing Risks. 469-485 - Wei Xie, Zhi-Sheng Ye:
Aggregate Discounted Warranty Cost Forecast for a New Product Considering Stochastic Sales. 486-497
Volume 65, Number 2, June 2016
- Yi-Ping Fang, Nicola Pedroni, Enrico Zio:
Resilience-Based Component Importance Measures for Critical Infrastructure Network Systems. 502-512 - Hai-Kun Wang, Hong-Zhong Huang, Yan-Feng Li, Yuanjian Yang:
Condition-Based Maintenance With Scheduling Threshold and Maintenance Threshold. 513-524 - Cuong Duc Dao, Ming Jian Zuo:
Selective Maintenance for Multistate Series Systems With S-Dependent Components. 525-539 - Maxim Finkelstein, Mahmood Shafiee, Anselme N. Kotchap:
Classical Optimal Replacement Strategies Revisited. 540-546 - Yan-Hui Lin, Yanfu Li, Enrico Zio:
Component Importance Measures for Components With Multiple Dependent Competing Degradation Processes and Subject to Maintenance. 547-557 - Alireza Alghassi, Suresh Perinpanayagam, Mohammad Samie:
Stochastic RUL Calculation Enhanced With TDNN-Based IGBT Failure Modeling. 558-573 - Michele Compare, Fabio Martini, Sara Mattafirri, Fausto Carlevaro, Enrico Zio:
Semi-Markov Model for the Oxidation Degradation Mechanism in Gas Turbine Nozzles. 574-581 - Guo Qing Cheng, Binghai Zhou, Ling Li:
A Semi-Geometric Process Model for a Deteriorating System and its Optimal Order-Replacement Policy. 582-592 - Ji Hwan Cha:
Optimal Replacement of Heterogeneous Items With Minimal Repairs. 593-603 - Minjae Park, Ki Mun Jung, Dong Ho Park:
A Generalized Age Replacement Policy for Systems Under Renewing Repair-Replacement Warranty. 604-612 - Lirong Cui, Jinbo Huang, Yan Li:
Degradation Models With Wiener Diffusion Processes Under Calibrations. 613-623 - Weiwen Peng, Yan-Feng Li, Yuanjian Yang, Shun-Peng Zhu, Hong-Zhong Huang:
Bivariate Analysis of Incomplete Degradation Observations Based on Inverse Gaussian Processes and Copulas. 624-639 - Zhengxin Zhang, Xiao-Sheng Si, Chang-Hua Hu, Qi Zhang, Tian-Mei Li, Cong-Qi Xu:
Planning Repeated Degradation Testing for Products With Three-Source Variability. 640-647 - Daniel Gil-Tomas, Joaquin Gracia-Moran, Juan-Carlos Baraza-Calvo, Luis J. Saiz-Adalid, Pedro J. Gil-Vicente:
Injecting Intermittent Faults for the Dependability Assessment of a Fault-Tolerant Microcomputer System. 648-661 - Yan Liu, Shubin Si, Lirong Cui, Zheng Wang, Shudong Sun:
A Generalized Griffith Importance Measure for Components With Multiple State Transitions. 662-673 - Lance Fiondella, Ashrafur Rahman, Nicholas Lownes, Veeresh Varad Basavaraj:
Defense of High-Speed Rail With an Evolutionary Algorithm Guided by Game Theory. 674-686 - Youji Hiraoka, Tamotsu Murakami, Katsunari Yamamoto, Yoshiyuki Furukawa, Hiroyuki Sawada:
Method of Computer-Aided Fault Tree Analysis for High-Reliable and Safety Design. 687-703 - David Gucik-Derigny, Rachid Outbib, Mustapha Ouladsine:
A Comparative Study of Unknown-Input Observers for Prognosis Applied to an Electromechanical System. 704-717 - Yang Hu, Piero Baraldi, Francesco Di Maio, Enrico Zio:
Online Performance Assessment Method for a Model-Based Prognostic Approach. 718-735 - Jian-Fei Zheng, Xiao-Sheng Si, Chang-Hua Hu, Zhengxin Zhang, Wei Jiang:
A Nonlinear Prognostic Model for Degrading Systems With Three-Source Variability. 736-750 - Nil Kamal Hazra, Asok K. Nanda:
Stochastic Comparisons Between Used Systems and Systems Made by Used Components. 751-762 - Jean-Luc Marichal:
Structure Functions and Minimal Path Sets. 763-768 - Zhaojun Li, Mohammadsadegh Mobin, Thomas Keyser:
Multi-Objective and Multi-Stage Reliability Growth Planning in Early Product-Development Stage. 769-781 - Sukhdev Singh, Yogesh Mani Tripathi:
Bayesian Estimation and Prediction for a Hybrid Censored Lognormal Distribution. 782-795 - William Volterman, Narayanaswamy Balakrishnan, Katherine F. Davies, H. K. T. Ng:
Exact Nonparametric Meta-Analysis of Lifetime Data From Systems With Known Signatures. 796-801 - Xiaoyan Zhu, Mahmoud Boushaba, Mohamed Reghioua:
Reliability and Joint Reliability Importance in a Consecutive-k-Within-m-out-of-n: F System With Markov-Dependent Components. 802-815 - Carolina Marchant, Víctor Leiva, Francisco José de A. Cysneiros:
A Multivariate Log-Linear Model for Birnbaum-Saunders Distributions. 816-827 - Majid Forghani-elahabad, Nezam Mahdavi-Amiri:
A New Algorithm for Generating All Minimal Vectors for the q SMPs Reliability Problem With Time and Budget Constraints. 828-842 - Ceki Franko, G. Yazgi Tütüncü:
Signature Based Reliability Analysis of Repairable Weighted k-Out-of-n: G Systems. 843-850 - Jacek Malinowski:
Reliability Analysis of a Flow Network with a Series-Parallel-Reducible Structure. 851-859 - M. Kayid, Salman Izadkhah, D. Almufarrej:
Random Effect Additive Mean Residual Life Model. 860-866 - Yi-Kuei Lin, Ding-Hsiang Huang, Louis Cheng-Lu Yeng:
Reliability Evaluation of a Hybrid Flow-Shop With Stochastic Capacity Within a Time Constraint. 867-877 - Qihong Duan, Junrong Liu:
Modelling a Bathtub-Shaped Failure Rate by a Coxian Distribution. 878-885 - Dingguo Hua, Elsayed A. Elsayed:
Reliability Estimation of k-out-of-n Pairs: G Balanced Systems With Spatially Distributed Units. 886-900 - Nan Chen, Yanlin Tang, Zhi-Sheng Ye:
Robust Quantile Analysis for Accelerated Life Test Data. 901-913 - Yao Cheng, Elsayed A. Elsayed:
Reliability Modeling and Prediction of Systems With Mixture of Units. 914-928 - Hui Dong, Lirong Cui:
System Reliability Under Cascading Failure Models. 929-940 - Dingguo Hua, Elsayed A. Elsayed:
Degradation Analysis of k-out-of-n Pairs: G Balanced System With Spatially Distributed Units. 941-956 - Man Ho Ling, Hon Keung Tony Ng, Ping Shing Chan, Narayanaswamy Balakrishnan:
Autopsy Data Analysis for a Series System With Active Redundancy Under a Load-Sharing Model. 957-968 - Serkan Eryilmaz, Markos V. Koutras, Ioannis S. Triantafyllou:
Mixed Three-State k-Out-of-n Systems With Components Entering at Different Performance Levels. 969-972 - Narayanaswamy Balakrishnan, Hon Yiu So, Man Ho Ling:
EM Algorithm for One-Shot Device Testing With Competing Risks Under Weibull Distribution. 973-991 - Somayeh Zarezadeh, Somayeh Ashrafi, Majid Asadi:
A Shock Model Based Approach to Network Reliability. 992-1000 - Yaonan Kong, Zhi-Sheng Ye:
A Cumulative-Exposure-Based Algorithm for Failure Data From a Load-Sharing System. 1001-1013 - Chen Li, Xiaohu Li:
Relative Ageing of Series and Parallel Systems With Statistically Independent and Heterogeneous Component Lifetimes. 1014-1021 - Serkan Eryilmaz:
Reliability of Systems With Multiple Types of Dependent Components. 1022-1029 - Qin Zhang, Zhan Zhang:
Dynamic Uncertain Causality Graph Applied to Dynamic Fault Diagnoses and Predictions With Negative Feedbacks. 1030-1044 - Yiwen Xu, Haitao Liao:
Reliability Analysis and Redundancy Allocation for a One-Shot System Containing Multifunctional Components. 1045-1057 - Gordon J. Savage, Young Kap Son:
An Extreme-Value Event Approach for Frequency-Domain Performance Reliability. 1058-1068 - Tsung-Ming Hsu, Takeshi Emura, Tsai-Hung Fan:
Reliability Inference for a Copula-Based Series System Life Test Under Multiple Type-I Censoring. 1069-1080 - Jiashen Teh, Ian Cotton:
Reliability Impact of Dynamic Thermal Rating System in Wind Power Integrated Network. 1081-1089
Volume 65, Number 3, September 2016
- Xin Xia, David Lo, Emad Shihab, Xinyu Wang:
Automated Bug Report Field Reassignment and Refinement Prediction. 1094-1113 - Haipeng Cai, Raúl A. Santelices, Siyuan Jiang:
Prioritizing Change-Impact Analysis via Semantic Program-Dependence Quantification. 1114-1132 - Zuohua Ding, Ting Xu, Tiantian Ye, Yuan Zhou:
Online Prediction and Improvement of Reliability for Service Oriented Systems. 1133-1148 - Luping Chen, John H. R. May:
A Diversity Model Based on Failure Distribution and its Application in Safety Cases. 1149-1162 - Rovedy Aparecida Busquim e Silva, Nanci Naomi Arai, Luciana Akemi Burgareli, José Maria Parente de Oliveira, Jorge Sousa Pinto:
Formal Verification With Frama-C: A Case Study in the Space Software Domain. 1163-1179 - Kai Chen, Yingjun Zhang, Peng Liu:
Dynamically Discovering Likely Memory Layout to Perform Accurate Fuzzing. 1180-1194 - Jungwoo Ryoo, Bryan Malone, Phillip A. Laplante, Priya Anand:
The Use of Security Tactics in Open Source Software Projects. 1195-1204 - Dianxiang Xu, Weifeng Xu, Manghui Tu, Ning Shen, William C. Chu, Chih-Hung Chang:
Automated Integration Testing Using Logical Contracts. 1205-1222 - Bo Jiang, Peng Chen, Wing Kwong Chan, Xinchao Zhang:
To What Extent is Stress Testing of Android TV Applications Automated in Industrial Environments? 1223-1239 - Sudarshan Roy, Krishna Daripa, Alak Kumar Datta:
K-Terminal Reliability of d-Trapezoid Graphs. 1240-1247 - Li Xu, Limei Lin, Shuming Zhou, Sun-Yuan Hsieh:
The Extra Connectivity, Extra Conditional Diagnosability, and t/m-Diagnosability of Arrangement Graphs. 1248-1262 - Wei-Chang Yeh:
New Method in Searching for All Minimal Paths for the Directed Acyclic Network Reliability Problem. 1263-1270 - Kamyar Sabri-Laghaie, Rassoul Noorossana:
Reliability and Maintenance Models for a Competing-Risk System Subjected to Random Usage. 1271-1283 - Ji Hwan Cha, Carmen Sangüesa, Inmaculada Torres Castro:
Maintenance Policy for a System With Stochastically Dependent Failure Modes With Shock-Accumulation Effect. 1284-1297 - Lu Zhao, Maoyin Chen, Donghua Zhou:
General (N, T, τ) Opportunistic Maintenance for Multicomponent Systems With Evident and Hidden Failures. 1298-1313 - Yaguo Lei, Naipeng Li, Szymon Gontarz, Jing Lin, Stanislaw Radkowski, Jacek Dybala:
A Model-Based Method for Remaining Useful Life Prediction of Machinery. 1314-1326 - Xun Xiao, Zhisheng Ye:
Optimal Design for Destructive Degradation Tests With Random Initial Degradation Values Using the Wiener Process. 1327-1342 - Cecile Chauvel, Jean-Yves Dauxois, Laurent Doyen, Olivier Gaudoin:
Parametric Bootstrap Goodness-of-Fit Tests for Imperfect Maintenance Models. 1343-1359 - Jinane Harmouche, Claude Delpha, Demba Diallo, Yann Le Bihan:
Statistical Approach for Nondestructive Incipient Crack Detection and Characterization Using Kullback-Leibler Divergence. 1360-1368 - Anna Richelli, Giovanni Delaini, Marco Grassi, Jean-Michel Redoute:
Susceptibility of Operational Amplifiers to Conducted EMI Injected Through the Ground Plane into Their Output Terminal. 1369-1379 - Hu-Chen Liu, Jian-Xin You, Ping Li, Qiang Su:
Failure Mode and Effect Analysis Under Uncertainty: An Integrated Multiple Criteria Decision Making Approach. 1380-1392 - Wei Zhao, Tao Tao, Enrico Zio, Wenbin Wang:
A Novel Hybrid Method of Parameters Tuning in Support Vector Regression for Reliability Prediction: Particle Swarm Optimization Combined With Analytical Selection. 1393-1405 - Bruno P. Leao, Takashi Yoneyama, João Paulo Pordeus Gomes:
Asymmetric Unscented Transform for Failure Prognosis. 1406-1415 - Hao Yan, Kaibo Liu, Xi Zhang, Jianjun Shi:
Multiple Sensor Data Fusion for Degradation Modeling and Prognostics Under Multiple Operational Conditions. 1416-1426 - Guangxing Bai, Pingfeng Wang:
Prognostics Using an Adaptive Self-Cognizant Dynamic System Approach. 1427-1437 - Mulugeta A. Haile, Jaret C. Riddick, Abey H. Assefa:
Robust Particle Filters for Fatigue Crack Growth Estimation in Rotorcraft Structures. 1438-1448 - Sudipta Das, Anup Dewanji, Ashis Kumar Chakraborty:
Software Reliability Modeling With Periodic Debugging Schedule. 1449-1456 - Ali Arab, Eylem Tekin, Amin Khodaei, Suresh K. Khator, Zhu Han:
System Hardening and Condition-Based Maintenance for Electric Power Infrastructure Under Hurricane Effects. 1457-1470 - Deyi Zhang, Andrew D. Bailey, Dragan Djurdjanovic:
Bayesian Identification of Hidden Markov Models and Their Use for Condition-Based Monitoring. 1471-1482 - Cheng Lian, C. L. Philip Chen, Zhigang Zeng, Wei Yao, Huiming Tang:
Prediction Intervals for Landslide Displacement Based on Switched Neural Networks. 1483-1495 - Liang Gao, Wenhua Chen, Ping Qian, Jun Pan, Qingchuan He:
Optimal Time-Censored Constant-Stress ALT Plan Based on Chord of Nonlinear Stress-Life Relationship. 1496-1508 - Cong Lin, Lirong Cui, David W. Coit, Min Lv:
Reliability Modeling on Consecutive-kr -out-of-nr: F Linear Zigzag Structure and Circular Polygon Structure. 1509-1521 - Rakesh Ranjan, Satyanshu K. Upadhyay:
Classical and Bayesian Estimation for the Parameters of a Competing Risk Model Based on Minimum of Exponential and Gamma Failures. 1522-1535 - Cong Cao, Zengfu Wang, Moshe Zukerman, Jonathan H. Manton, Alain Bensoussan, Yu Wang:
Optimal Cable Laying Across an Earthquake Fault Line Considering Elliptical Failures. 1536-1550 - Wujun Si, Qingyu Yang:
A Generalized Mixed Effect Kijima Model and Application in Optimal Maintenance Planning. 1551-1561 - Serkan Eryilmaz, Özlem Ege Oruç, Volkan Oger:
Joint Reliability Importance in Coherent Systems With Exchangeable Dependent Components. 1562-1570 - Panlop Zeephongsekul, Chathuri L. Jayasinghe, Lance Fiondella, Vidhyashree Nagaraju:
Maximum-Likelihood Estimation of Parameters of NHPP Software Reliability Models Using Expectation Conditional Maximization Algorithm. 1571-1583 - Lian Yu, Wei-Tek Tsai, Gian Perrone:
Testing Context-Aware Applications Based on Bigraphical Modeling. 1584-1611 - Peican Zhu, Jie Han, Leibo Liu, Fabrizio Lombardi:
Reliability Evaluation of Phased-Mission Systems Using Stochastic Computation. 1612-1623 - Winnie H. Fu, Wan-Chen Lee, James C. Fu:
Distributions and Causation Probabilities of Multiple-Run-Rules and Their Applications in System Reliability, Quality Control, and Start-Up Tests. 1624-1628
Volume 65, Number 4, December 2016
- Gao-Rong Ning, Jing Zhao, Yunlong Lou, Javier Alonso, Rivalino Matias, Kishor S. Trivedi, Bei-Bei Yin, Kai-Yuan Cai:
Optimization of Two-Granularity Software Rejuvenation Policy Based on the Markov Regenerative Process. 1630-1646 - Jiang Ming, Fangfang Zhang, Dinghao Wu, Peng Liu, Sencun Zhu:
Deviation-Based Obfuscation-Resilient Program Equivalence Checking With Application to Software Plagiarism Detection. 1647-1664 - Marcello Cinque, Domenico Cotroneo, Raffaele Della Corte, Antonio Pecchia:
Characterizing Direct Monitoring Techniques in Software Systems. 1665-1681 - Yulei Sui, Ding Ye, Yu Su, Jingling Xue:
Eliminating Redundant Bounds Checks in Dynamic Buffer Overflow Detection Using Weakest Preconditions. 1682-1699 - Xiaowang Li, Shuming Zhou, Xiang Xu, Limei Lin, Dajin Wang:
The Reliability Analysis Based on Subsystems of (n, k)-Star Graph. 1700-1709 - Elena Zaitseva, Vitaly G. Levashenko:
Construction of a Reliability Structure Function Based on Uncertain Data. 1710-1723 - Jingjing He, Xuefei Guan, Ratneshwar Jha:
Improve the Accuracy of Asymptotic Approximation in Reliability Problems Involving Multimodal Distributions. 1724-1736 - Piao Chen, Ancha Xu, Zhi-Sheng Ye:
Generalized Fiducial Inference for Accelerated Life Tests With Weibull Distribution and Progressively Type-II Censoring. 1737-1744 - Zuyuan Zhang, Wei An, Fang-Ming Shao:
Cascading Failures on Reliability in Cyber-Physical System. 1745-1754 - Bi Wu, Yuanqing Cheng, Jianlei Yang, Aida Todri-Sanial, Weisheng Zhao:
Temperature Impact Analysis and Access Reliability Enhancement for 1T1MTJ STT-RAM. 1755-1768 - Enrico Zio:
Some Challenges and Opportunities in Reliability Engineering. 1769-1782 - Shaodi Wang, Henry Chaohong Hu, Hongzhong Zheng, Puneet Gupta:
MEMRES: A Fast Memory System Reliability Simulator. 1783-1797 - Gregory Levitin, Liudong Xing, Yuanshun Dai:
Cold Standby Systems With Imperfect Backup. 1798-1809 - Xin Xia, David Lo, Xinyu Wang, Xiaohu Yang:
Collective Personalized Change Classification With Multiobjective Search. 1810-1829 - Jungho Park, Jong Moon Ha, Hyun-Seok Oh, Byeng D. Youn, Joo Ho Choi, Nam Ho Kim:
Model-Based Fault Diagnosis of a Planetary Gear: A Novel Approach Using Transmission Error. 1830-1841 - Jason W. Rupe:
Network Nodal Independence, Hierarchical Path Search, and Model Reuse for Network Availability Computation. 1842-1851 - Taimour Wehbe, Xiaofang Wang:
Secure and Dependable NoC-Connected Systems on an FPGA Chip. 1852-1863 - Ji Hwan Cha, Maxim Finkelstein:
On Ageing Concepts for Repairable Items From Heterogeneous Populations. 1864-1870 - Antonio Sanchez-Clemente, Luis Entrena, Radek Hrbacek, Lukás Sekanina:
Error Mitigation Using Approximate Logic Circuits: A Comparison of Probabilistic and Evolutionary Approaches. 1871-1883
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
last updated on 2025-01-24 17:05 CET by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint
dblp was originally created in 1993 at:
since 2018, dblp has been operated and maintained by:
the dblp computer science bibliography is funded and supported by:
