Special Session (New Topic): Emerging Computing and Testing Techniques - Max M. Shulaker; Laurent Lebrun; Bozena Kaminska; Bernard Courtois (37th IEEE VLSI Test Symposium, VTS 2019, Monterey, CA, USA, April 23-25, 2019, 2019)

Special session on quantum systems: Next challenges in design, test, integration - Carlo Reita; Jonathan Baugh; Gabriel Poulin-Lamarre; Bozena Kaminska; Bernard Courtois (36th IEEE VLSI Test Symposium, VTS 2018, San Francisco, CA, USA, April 22-25, 2018, 2018)

Special Section NANOTECH 2013 - Bernard Courtois (Microelectron. J., 2014)

New topic session 2B: Co-design and reliability of power electronic modules - Current status and future challenges - Bozena Kaminska; Bernard Courtois; Chris Bailey (32nd IEEE VLSI Test Symposium, VTS 2014, Napa, CA, USA, April 13-17, 2014, 2014)

New topic session 7B: Challenges and opportunities in test and design for test (DFT) of MEMS sensors - Bozena Kaminska; Bernard Courtois; Mary Ann Maher (32nd IEEE VLSI Test Symposium, VTS 2014, Napa, CA, USA, April 13-17, 2014, 2014)

Panel: the heritage of Mead & Conway: what has remained the same, what was missed, what has changed, what lies ahead - Marco Casale-Rossi; Alberto L. Sangiovanni-Vincentelli; Luca P. Carloni; Bernard Courtois; Hugo De Man; Antun Domic; Jan M. Rabaey (Design, Automation and Test in Europe, DATE 13, Grenoble, France, March 18-22, 2013, 2013)

New topic session 7B: Challenges and directions for ultra-low voltage VLSI circuits and systems: CMOS and beyond - Bozena Kaminska; Bernard Courtois; Massimo Alioto (31st IEEE VLSI Test Symposium, VTS 2013, Berkeley, CA, USA, April 29 - May 2, 2013, 2013)

New topic session 2B: Why (Re-)Designing Biology is \(_*\)Slightly\(_*\) more challenging than designing electronics - Bozena Kaminska; Bernard Courtois; Soha Hassoun (31st IEEE VLSI Test Symposium, VTS 2013, Berkeley, CA, USA, April 29 - May 2, 2013, 2013)

Special section NANOTECH 2011 - Bernard Courtois (Microelectron. J., 2012)

ICs and MEMS for energy management - Bernard Courtois (11th Latin American Test Workshop, LATW 2010, Punta del Este, Uruguay, March 28-30, 2010, 2010)

European Nano Systems 2007 - Bernard Courtois (Microelectron. J., 2009)

Infrastructures for Education, Research and Industry in Microelectronics A Look Worldwide and a Look at India - Bernard Courtois; Kholdoun Torki; Sophie Dumont; Sylvaine Eyraud; Jean-François Paillotin; Gregory di Pendina (VLSI Design 2009: Improving Productivity through Higher Abstraction, The 22nd International Conference on VLSI Design, New Delhi, India, 5-9 January 2009, 2009)

Special Session 8: New Topics: At-Speed Testing in the Face of Process Variations - Bernard Courtois; Chandu Visweswariah (27th IEEE VLSI Test Symposium, VTS 2009, May 3-7, 2009, Santa Cruz, California, USA, 2009)

Microscale and Nanoscale Thermal Characterization of Integrated Circuit Chips - Bernard Courtois; Ali Shakouri (27th IEEE VLSI Test Symposium, VTS 2009, May 3-7, 2009, Santa Cruz, California, USA, 2009)

European Nano Systems 2006 - Bernard Courtois (Microelectron. J., 2008)

Heterogeneous systems on chip and systems in package - Ian O'Connor; Bernard Courtois; Krishnendu Chakrabarty; N. Delorme; M. Hampton; J. Hartung (2007 Design, Automation and Test in Europe Conference and Exposition, DATE 2007, Nice, France, April 16-20, 2007, 2007)

Characterisation of the Etching Quality in Micro-Electro-Mechanical Systems by Thermal Transient Methodology - Péter G. Szabó; Balázs Németh; Márta Rencz; Bernard Courtois (CoRR, 2007)

Session Abstract - Bernard Courtois (24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA, 2006)

Special issue on European Micro and Nano Systems (EMN04) held in Paris, 20-21 October, 2004 - Bernard Courtois (Microelectron. J., 2005)

Infrastructures for Education, Research and Industry in Microelectronics - A review - Bernard Courtois (2nd IEEE International Workshop on Electronic Design, Test and Applications (DELTA 2004), 28-30 January 2004, Perth, Australia, 2004)

On-chip testing of embedded silicon transducers - Salvador Mir; Benoît Charlot; Libor Rufer; Bernard Courtois (Proceedings 2004 IEEE International SOC Conference, September 12-15, 2004, Hilton Santa Clara, CA, USA, 2004)

On-chip testing of embedded transducers - Salvador Mir; Libor Rufer; Bernard Courtois (17th International Conference on VLSI Design (VLSI Design 2004), with the 3rd International Conference on Embedded Systems Design, 5-9 January 2004, Mumbai, India, 2004)

Infrastrukturen für Forschung und Lehre: von nationalen Initiativen zu weltweiten Entwicklungen - Bernard Courtois (it Inf. Technol., 2003)

Generation of Electrically Induced Stimuli for MEMS Self-Test - Benoît Charlot; Salvador Mir; Fabien Parrain; Bernard Courtois (J. Electron. Test., 2001)

An Analog-based Approach for MEMS Testing - Bernard Courtois; Salvador Mir; Benoît Charlot; Marcelo Lubaszewski (2nd Latin American Test Workshop, LATW 2001, Cancun, Mexico, February 11-14, 2001, 2001)

CMP: The Access to Advanced Low Costy Manufacturing - Kholdoun Torki; Bernard Courtois (2001 International Conference on Microelectronics Systems Education, MSE 2001, Las Vegas, NV, USA, July 17-18, 2001, 2001)

Electrically Induced Stimuli For MEMS Self-Test - Benoît Charlot; Salvador Mir; Fabien Parrain; Bernard Courtois (19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA, 2001)

Extending Fault-Based Testing to Microelectromechanical Systems - Salvador Mir; Benoît Charlot; Bernard Courtois (J. Electron. Test., 2000)

IDDQ Testing of Submicron CMOS - by Cooling? - Márta Rencz; Vladimír Székely; S. Török; Kholdoun Torki; Bernard Courtois (J. Electron. Test., 2000)

Analog ALC crystal oscillators for high-temperature applications - Raúl Andrés Bianchi; Jean-Michel Karam; Bernard Courtois (IEEE J. Solid State Circuits, 2000)

Design of self-checking fully differential circuits and boards - Marcelo Lubaszewski; Salvador Mir; Vladimir Kolarik; C. Nielsen; Bernard Courtois (IEEE Trans. Very Large Scale Integr. Syst., 2000)

Towards design and validation of mixed-technology SOCs - Salvador Mir; Benoît Charlot; Gabriela Nicolescu; Philippe Coste; Fabien Parrain; Nacer-Eddine Zergainoh; Bernard Courtois; Ahmed Amine Jerraya; Márta Rencz (Proceedings of the 10th ACM Great Lakes Symposium on VLSI 2000, Chicago, Illinois, USA, March 2-4, 2000, 2000)

Guest Editors' Introduction - Bernard Courtois; R. D. (Shawn) Blanton (IEEE Des. Test Comput., 1999)

Extending fault-based testing to microelectromechanical systems - Salvador Mir; Benoît Charlot; Bernard Courtois (4th European Test Workshop, ETW 1999, Constance, Germany, May 25-28, 1999, 1999)

Fault modeling of suspended thermal MEMS - Benoît Charlot; Salvador Mir; Érika F. Cota; Marcelo Lubaszewski; Bernard Courtois (Proceedings IEEE International Test Conference 1999, Atlantic City, NJ, USA, 27-30 September 1999, 1999)

Advanced Low Cost Manufacturing From CMP Service - Kholdoun Torki; Bernard Courtois (IEEE International Conference on Microelectronic Systems Education, MSE 1999, Arlington, Virginia, USA, July 19-21, 1999, 1999)

Design and Test of MEMs - Bernard Courtois; Jean-Michel Karam; Salvador Mir; Marcelo Lubaszewski; Vladimír Székely; Márta Rencz; Klaus Hofmann; Manfred Glesner (12th International Conference on VLSI Design (VLSI Design 1999), 10-13 January 1999, Goa, India, 1999)

Tracing the Thermal Behavior of ICs - Vladimír Székely; Márta Rencz; Bernard Courtois (IEEE Des. Test Comput., 1998)

Thermal Monitoring of Self-Checking Systems - Vladimír Székely; Márta Rencz; Jean-Michel Karam; Marcelo Lubaszewski; Bernard Courtois (J. Electron. Test., 1998)

A Reliable Fail-Safe System - Marcelo Lubaszewski; Bernard Courtois (IEEE Trans. Computers, 1998)

Microsystems Testing: an Approach and Open Problems - Marcelo Lubaszewski; Érika F. Cota; Bernard Courtois (1998 Design, Automation and Test in Europe (DATE '98), February 23-26, 1998, Le Palais des Congrès de Paris, Paris, France, 1998)

3D CMOS SOL for high performance computing - Selim J. Abou-Samra; P. A. Aisa; Alain Guyot; Bernard Courtois (Proceedings of the 1998 International Symposium on Low Power Electronics and Design, 1998, Monterey, California, USA, August 10-12, 1998, 1998)

Failure mechanisms and fault classes for CMOS-compatible microelectromechanical systems - A. Castillejo; D. Veychard; Salvador Mir; Jean-Michel Karam; Bernard Courtois (Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998, 1998)

CAD Tools for Bridging Microsystems and Foundries - Jean-Michel Karam; Bernard Courtois; Hicham Boutamine (IEEE Des. Test Comput., 1997)

CAD and Foundries for Microsystems - Jean-Michel Karam; Bernard Courtois; Hicham Boutamine; P. Drake; András Poppe; Vladimír Székely; Márta Rencz; Klaus Hofmann; Manfred Glesner (Proceedings of the 34st Conference on Design Automation, Anaheim, California, USA, Anaheim Convention Center, June 9-13, 1997, 1997)

Generation of the HDL-A-model of a micromembrane from its finite-element-description - Klaus Hofmann; Manfred Glesner; Nicu Sebe; Anca Manuela Manolescu; Santiago Marco; Josep Samitier; Jean-Michel Karam; Bernard Courtois (European Design and Test Conference, ED&TC '97, Paris, France, 17-20 March 1997, 1997)

Integrating on-chip temperature sensors into DfT schemes and BIST architectures - Vladimír Székely; Márta Rencz; Bernard Courtois (15th IEEE VLSI Test Symposium (VTS'97), April 27-May 1, 1997, Monterey, California, USA, 1997)

Guest Editors' Introduction: Mixed Analog and Digital Systems - Bozena Kaminska; Bernard Courtois (IEEE Des. Test Comput., 1996)

Second Therminic Workshop - Bernard Courtois (IEEE Des. Test Comput., 1996)

Guest editorial - Bozena Kaminska; Bernard Courtois (J. Electron. Test., 1996)

Fault-based ATPG for linear analog circuits with minimal size multifrequency test sets - Salvador Mir; Marcelo Lubaszewski; Bernard Courtois (J. Electron. Test., 1996)

Unified built-in self-test for fully differential analog circuits - Salvador Mir; Marcelo Lubaszewski; Bernard Courtois (J. Electron. Test., 1996)

Thermal Monitoring Of Safety-Critical Integrated Systems - Vladimír Székely; Márta Rencz; Jean-Michel Karam; Marcelo Lubaszewski; Bernard Courtois (5th Asian Test Symposium (ATS '96), November 20-22, 1996, Hsinchu, Taiwan, 1996)

Automatic Test Generation for Maximal Diagnosis of Linear Analogue Circuits - Salvador Mir; Bernard Courtois; Marcelo Lubaszewski; Vladimir Kolarik (1996 European Design and Test Conference, ED&TC 1996, Paris, France, March 11-14, 1996, 1996)

High level CAD melds microsystems with foundries - Jean-Michel Karam; Bernard Courtois; M. Bauge (1996 European Design and Test Conference, ED&TC 1996, Paris, France, March 11-14, 1996, 1996)

Applied design and analysis of microsystems - Jean-Michel Karam; Bernard Courtois; András Poppe; Klaus Hofmann; Márta Rencz; Manfred Glesner; Vladimír Székely (1996 European Design and Test Conference, ED&TC 1996, Paris, France, March 11-14, 1996, 1996)

Conference Reports - Sreejit Chakravarty; Ramalingam Sridhar; Shambhu J. Upadhyaya; Yervant Zorian; Gil Philips; Bozena Kaminska; Bernard Courtois (IEEE Des. Test Comput., 1995)

Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers - Sybille Hellebrand; Janusz Rajski; Steffen Tarnick; Srikanth Venkataraman; Bernard Courtois (IEEE Trans. Computers, 1995)

Analog checkers with absolute and relative tolerances - Vladimir Kolarik; Salvador Mir; Marcelo Lubaszewski; Bernard Courtois (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1995)

Panel: New Research Problems in the Emerging Test Technology - Vishwani D. Agrawal; Bernard Courtois; Fumiyasu Hirose; Sandip Kundu; Chung-Len Lee; Yinghua Min; Parimal Pal Chaudhuri (4th Asian Test Symposium (ATS '95), November 23-24, 1995. Bangalore, India, 1995)

Mixed-signal circuits and boards for high safety applications - Marcelo Lubaszewski; Vladimir Kolarik; Salvador Mir; C. Nielsen; Bernard Courtois (1995 European Design and Test Conference, ED&TC 1995, Paris, France, March 6-9, 1995, 1995)

Frequency-based BIST for analog circuit testin - Khaled Saab; Bozena Kaminska; Bernard Courtois; Marcelo Lubaszewski (13th IEEE VLSI Test Symposium (VTS'95), April 30 - May 3, 1995, Princeton, New Jersey, USA, 1995)

Built-in self-test and fault diagnosis of fully differential analogue circuits - Salvador Mir; Vladimir Kolarik; Marcelo Lubaszewski; C. Nielsen; Bernard Courtois (Proceedings of the 1994 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 1994, San Jose, California, USA, November 6-10, 1994, 1994)

Designing self-exercising analogue checkers - Vladimir Kolarik; Marcelo Lubaszewski; Bernard Courtois (12th IEEE VLSI Test Symposium (VTS'94), April 25-28, 1994, Cherry Hill, New Jersey, USA, 1994)

Quiescent Current Monitoring to Improve the Reliability of Electronic Systems in Space Radiation Environments - F. L. Vargas; Michael Nicolaidis; Bernard Courtois (Proceedings 1993 International Conference on Computer Design: VLSI in Computers & Processors, ICCD '93, Cambridge, MA, USA, October 3-6, 1993, 1993)

Generation of Vector Patterns Through Reseeding of Multipe-Polynominal Linear Feedback Shift Registers - Sybille Hellebrand; Steffen Tarnick; Bernard Courtois; Janusz Rajski (Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992, 1992)

On the Design of Self-Checking Boundary Scannable Boards - Marcelo Lubaszewski; Bernard Courtois (Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992, 1992)

Towards System level modeling and synthesis - Ahmed Amine Jerraya; Kevin O'Brien; Inhag Park; Bernard Courtois (Proceedings of the Fifth International Conference on VLSI Design, VLSI Design 1992, Bangalore, India, January 4-7, 1992, 1992)

Silicon compilation of hierarchical control sections with unified BIST testability - Michael Nicolaidis; Kholdoun Torki; Ahmed Amine Jerraya; Bernard Courtois (Microprocess. Microsystems, 1991)

Built-In Self-Test for Multi-Port RAMs - Vladimir Castro Alves; Michael Nicolaidis; P. Lestrat; Bernard Courtois (1991 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 1993, Santa Clara, CA, USA, November 11-14, 1991. Digest of Technical Papers, 1991)

Coupling Electron-Beam Probing with Knowledge-Based Fault Localization - M. Marzouki; J. Laurent; Bernard Courtois (Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991, 1991)

Robust tests for stuck-open faults and design for testability of reconvergent fan-out CMOS logic networks - F. Darlay; Bernard Courtois (European Design Automation Conference, EURO-DAC 1990, Glasgow, Scotland, UK, March 12-15, 1990, 1990)

NAUTILE: a safe environment for silicon compilation - Philippe Bondono; Ahmed Amine Jerraya; Armand Hornik; Bernard Courtois; D. Bonifas (European Design Automation Conference, EURO-DAC 1990, Glasgow, Scotland, UK, March 12-15, 1990, 1990)

Self-checking logic arrays - Michael Nicolaidis; Bernard Courtois (Microprocess. Microsystems, 1989)

Random Pattern Testing Versus Deterministic Testing of RAM's - René David; Antoine Fuentes; Bernard Courtois (IEEE Trans. Computers, 1989)

A generalized theory of fail-safe systems - Michael Nicolaidis; Serge Noraz; Bernard Courtois (Proceedings of the Nineteenth International Symposium on Fault-Tolerant Computing, FTCS 1989, Chicago, IL, USA, 21-23 June, 1989, 1989)

Definition and Design of Strongly Language Disjoint Checkers - Ingrid Jansch; Bernard Courtois (IEEE Trans. Computers, 1988)

Strongly Code Disjoint Checkers - Michael Nicolaidis; Bernard Courtois (IEEE Trans. Computers, 1988)

UBIST version of the SYCO's control section compiler - Kholdoun Torki; Michael Nicolaidis; Ahmed Amine Jerraya; Bernard Courtois (Computer Design: VLSI in Computers and Processors, ICCD 1988., Proceedings of the 1988 IEEE International Conference on, Rye Brook, NY, USA, October 3-5, 1988, 1988)

Fault Simulation and Test Pattern Generation at the Multiple-Valued Switch Level - Jean Paul Caisso; Bernard Courtois (Proceedings International Test Conference 1988, Washington, D.C., USA, September 1988, 1988)

Scanning the issue - Bernard Courtois; Marco Mezzalama (Proc. IEEE, 1986)

Principles of the SYCO compiler - Ahmed Amine Jerraya; Patrick Varinot; Robert Jamier; Bernard Courtois (Proceedings of the 23rd ACM/IEEE Design Automation Conference. Las Vegas, NV, USA, June, 1986, 1986)

Towards Automatic Failure Analysis of Complex ICs Through E-Beam Testing - J. Laurent; L. Bergher; Bernard Courtois; Jacques P. Collin (Proceedings International Test Conference 1986, Washington, D.C., USA, September 1986, 1986)

Functional testing vs. structural testing of RAMs - H. Sahami; Bernard Courtois (Fehlertolerierende Rechensysteme, 2. GI/NTG/GMR-Fachtagung, Bonn, 19.-21. September 1984, Proceedings, 1984)

A new domain for image analysis: VLSI circuits testing, with Romuald, specialized in parallel image processing - Claire Rubat Du Mérac; P. Jutier; J. Laurent; Bernard Courtois (Pattern Recognit. Lett., 1983)

Analytical Testing of Data Processing Sections of Integrated CPUs - Bernard Courtois (Proceedings International Test Conference 1981, Philadelphia, PA, USA, October 1981, 1981)

Etude d'un calculateur tolérant des pannes, ses fiabilité, sécurité, performance et coût - Bernard Courtois (Grenoble Institute of Technology, France, 1976)

On balancing hardware-firmware for designing a fault-tolerant computers' series - Bernard Courtois; Gabriele Saucier (Proceedings of the 8th annual workshop on Microprogramming, MICRO 1975, Chicago, Illinois, USA, September 21-23, 1975, 1975)