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Haoze Luo
2020 – today
- 2023
- [j11]Jianlong Kang
, Qing Liu
, Haoze Luo
, Hu Cao, Zi-Hui Zhang
, Zhen Xin
:
Investigation of Off-State Stress Induced Degradation of SiC MOSFETs Under Short-Circuit Condition. IEEE Trans. Ind. Electron. 70(5): 5224-5234 (2023)
2010 – 2019
- 2019
- [j10]Kongjing Li
, Gui Yun Tian
, Xiaotian Chen, Chaoqing Tang
, Haoze Luo
, Wuhua Li
, Bin Gao
, Xiangning He
, Nick Wright
:
AR-Aided Smart Sensing for In-Line Condition Monitoring of IGBT Wafer. IEEE Trans. Ind. Electron. 66(10): 8197-8204 (2019) - 2018
- [j9]Haoze Luo
, Paula Diaz Reigosa
, Francesco Iannuzzo
, Frede Blaabjerg:
On-line solder layer degradation measurement for SiC-MOSFET modules under accelerated power cycling condition. Microelectron. Reliab. 88-90: 563-567 (2018) - [j8]Lorenzo Ceccarelli
, Haoze Luo, Francesco Iannuzzo
:
Investigating SiC MOSFET body diode's light emission as temperature-sensitive electrical parameter. Microelectron. Reliab. 88-90: 627-630 (2018) - [j7]Haoze Luo
, Wuhua Li, Francesco Iannuzzo
, Xiangning He, Frede Blaabjerg
:
Enabling Junction Temperature Estimation via Collector-Side Thermo-Sensitive Electrical Parameters Through Emitter Stray Inductance in High-Power IGBT Modules. IEEE Trans. Ind. Electron. 65(6): 4724-4738 (2018) - 2017
- [j6]Haoze Luo
, Wuhua Li, Xiangning He, Francesco Iannuzzo
, Frede Blaabjerg:
Uneven temperature effect evaluation in high-power IGBT inverter legs and relative test platform design. Microelectron. Reliab. 76-77: 123-130 (2017) - [j5]Haoze Luo
, Nick Baker, Francesco Iannuzzo
, Frede Blaabjerg:
Die degradation effect on aging rate in accelerated cycling tests of SiC power MOSFET modules. Microelectron. Reliab. 76-77: 415-419 (2017) - [c1]Haoze Luo, Francesco Iannuzzo
, Frede Blaabjerg, Wuhua Li, Xiangning He:
Separation test method for investigation of current density effects on bond wires of SiC power MOSFET modules. IECON 2017: 1525-1530 - 2016
- [j4]Haoze Luo
, Francesco Iannuzzo
, Paula Diaz Reigosa, Frede Blaabjerg
, Wuhua Li, Xiangning He:
Modern IGBT gate driving methods for enhancing reliability of high-power converters - An overview. Microelectron. Reliab. 58: 141-150 (2016) - 2015
- [j3]Sheng Zong, Haoze Luo, Wuhua Li, Xiangning He, Changliang Xia:
Theoretical Evaluation of Stability Improvement Brought by Resonant Current Loop for Paralleled LLC Converters. IEEE Trans. Ind. Electron. 62(7): 4170-4180 (2015) - [j2]Wuhua Li, Chi Xu, Haoze Luo, Yihua Hu, Xiangning He, Changliang Xia:
Decoupling-Controlled Triport Composited DC/DC Converter for Multiple Energy Interface. IEEE Trans. Ind. Electron. 62(7): 4504-4513 (2015) - [j1]Wuhua Li, Yunjie Gu, Haoze Luo, Wenfeng Cui, Xiangning He, Changliang Xia:
Topology Review and Derivation Methodology of Single-Phase Transformerless Photovoltaic Inverters for Leakage Current Suppression. IEEE Trans. Ind. Electron. 62(7): 4537-4551 (2015)
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last updated on 2025-01-20 22:57 CET by the dblp team
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