A Built-In Parametric Timing Measurement Unit - Ming-Jun Hsiao; Jing-Reng Huang; Tsin-Yuan Chang (IEEE Des. Test Comput., 2004)

A Measurement Unit for Input Signal Analysis of SRAM Sense Amplifier - Yi-Ming Sheng; Ming-Jun Hsiao; Tsin-Yuan Chang (13th Asian Test Symposium (ATS 2004), 15-17 November 2004, Kenting, Taiwan, 2004)

An Access Timing Measurement Unit of Embedded Memory - Shu-Rong Lee; Ming-Jun Hsiao; Tsin-Yuan Chang (11th Asian Test Symposium (ATS 2002), 18-20 November 2002, Guam, USA, 2002)

An Embedded Built-In-Self-Test Approach for Analog-to-Digital Converters - Sheng-Hung Hsieh; Ming-Jun Hsiao; Tsin-Yuan Chang (11th Asian Test Symposium (ATS 2002), 18-20 November 2002, Guam, USA, 2002)

An Embedded Built-in-Self-Test Approach for Digital-to-Analog Converters - Jeng-Horng Tsai; Ming-Jun Hsiao; Tsin-Yuan Chang (10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan, 2001)

A low-cost CMOS time interval measurement core - Ming-Jun Hsiao; Jing-Reng Huang; Shao-Shen Yang; Tsin-Yuan Chang (Proceedings of the 2001 International Symposium on Circuits and Systems, ISCAS 2001, Sydney, Australia, May 6-9, 2001, 2001)

A built-in timing parametric measurement unit - Ming-Jun Hsiao; Jing-Reng Huang; Shao-Shen Yang; Tsin-Yuan Chang (Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001, 2001)