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2020 – today
- 2024
[j15]Thanasis Kotsiopoulos
, Gerasimos Papakostas, Thanasis Vafeiadis, Vasileios Dimitriadis, Alexandros Nizamis, Andrea Bolzoni, Davide Bellinati, Dimosthenis Ioannidis, Konstantinos Votis, Dimitrios Tzovaras, Panagiotis G. Sarigiannidis:
Revolutionizing defect recognition in hard metal industry through AI explainability, human-in-the-loop approaches and cognitive mechanisms. Expert Syst. Appl. 255: 124839 (2024)- [j14]Thanasis Antamis, Anastasios Drosou, Thanasis Vafeiadis, Alexandros Nizamis, Dimosthenis Ioannidis, Dimitrios Tzovaras:
Interpretability of deep neural networks: A review of methods, classification and hardware. Neurocomputing 601: 128204 (2024) - 2023
- [j13]Kalliopi Tsolaki, Thanasis Vafeiadis, Alexandros Nizamis, Dimosthenis Ioannidis, Dimitrios Tzovaras:
Utilizing machine learning on freight transportation and logistics applications: A review. ICT Express 9(3): 284-295 (2023) - [c13]Dimitris Dimoudis, Thanasis Vafeiadis, Alexandros Nizamis, Emma Musiari, Luca Ziliotti, Dimosthenis Ioannidis, Dimitrios Tzovaras:
A Holistic Framework for Production Scheduling in Industry 4.0. DCOSS-IoT 2023: 269-276 - [c12]Dimitris Dimoudis, Thanasis Vafeiadis, Alexandros Nizamis, Dimosthenis Ioannidis, Dimitrios Tzovaras:
Utilizing an adaptive window rolling median methodology for time series anomaly detection. ISM 2023: 584-593 - 2022
- [j12]Vaia Rousopoulou, Thanasis Vafeiadis, Alexandros Nizamis, Ioannis Iakovidis, Leonidas Samaras, Alkis Kirtsoglou, Konstantinos Georgiadis, Dimosthenis Ioannidis, Dimitrios Tzovaras:
Cognitive analytics platform with AI solutions for anomaly detection. Comput. Ind. 134: 103555 (2022) - [j11]Thanasis Vafeiadis, Nikolaos Kolokas, Nikolaos Dimitriou, Angeliki Zacharaki, Murat Yildirim, Habibe Gülben Selvi, Dimosthenis Ioannidis, Dimitrios Tzovaras:
A comparison of 2DCNN network architectures and boosting techniques for regression-based textile whiteness estimation. Simul. Model. Pract. Theory 114: 102400 (2022) - 2021
- [c11]Panagiotis Valatsos, Thanasis Vafeiadis, Alexandros Nizamis, Dimosthenis Ioannidis, Dimitrios Tzovaras:
Freight transportation route time prediction with ensemble learning techniques. PCI 2021: 52-57 - 2020
- [j10]Evdoxia Eirini Lithoxoidou, Chrysovalantou Ziogou, Thanasis Vafeiadis, Stelios Krinidis, Dimosthenis Ioannidis, Spyros Voutetakis, Dimitrios Tzovaras:
Towards the behavior analysis of chemical reactors utilizing data-driven trend analysis and machine learning techniques. Appl. Soft Comput. 94: 106464 (2020) - [j9]Angeliki Zacharaki, Thanasis Vafeiadis, Nikolaos Kolokas, Aikaterini Vaxevani, Yuchun Xu, Michael Peschl, Dimosthenis Ioannidis, Dimitrios Tzovaras:
RECLAIM: Toward a New Era of Refurbishment and Remanufacturing of Industrial Equipment. Frontiers Artif. Intell. 3: 570562 (2020) - [j8]Vaia Rousopoulou, Alexandros Nizamis, Thanasis Vafeiadis, Dimosthenis Ioannidis, Dimitrios Tzovaras:
Predictive Maintenance for Injection Molding Machines Enabled by Cognitive Analytics for Industry 4.0. Frontiers Artif. Intell. 3: 578152 (2020) - [j7]Nikolaos Dimitriou, Lampros Leontaris, Thanasis Vafeiadis, Dimosthenis Ioannidis, Tracy Wotherspoon, Gregory Tinker, Dimitrios Tzovaras:
A Deep Learning framework for simulation and defect prediction applied in microelectronics. Simul. Model. Pract. Theory 100: 102063 (2020) - [j6]Nikolaos Kolokas, Thanasis Vafeiadis, Dimosthenis Ioannidis, Dimitrios Tzovaras:
A generic fault prognostics algorithm for manufacturing industries using unsupervised machine learning classifiers. Simul. Model. Pract. Theory 103: 102109 (2020) - [j5]Nikolaos Dimitriou, Lampros Leontaris, Thanasis Vafeiadis, Dimosthenis Ioannidis, Tracy Wotherspoon, Gregory Tinker, Dimitrios Tzovaras:
Fault Diagnosis in Microelectronics Attachment Via Deep Learning Analysis of 3-D Laser Scans. IEEE Trans. Ind. Electron. 67(7): 5748-5757 (2020) - [i2]Nikolaos Dimitriou, Lampros Leontaris, Thanasis Vafeiadis, Dimosthenis Ioannidis, Tracy Wotherspoon, Gregory Tinker, Dimitrios Tzovaras:
Fault Diagnosis in Microelectronics Attachment via Deep Learning Analysis of 3D Laser Scans. CoRR abs/2002.10974 (2020) - [i1]Nikolaos Dimitriou, Lampros Leontaris, Thanasis Vafeiadis, Dimosthenis Ioannidis, Tracy Wotherspoon, Gregory Tinker, Dimitrios Tzovaras:
A Deep Learning Framework for Simulation and Defect Prediction Applied in Microelectronics. CoRR abs/2002.10986 (2020)
2010 – 2019
- 2019
- [c10]Achilleas Pasias, Thanasis Vafeiadis, Dimosthenis Ioannidis, Dimitrios Tzovaras:
Forecasting Bath and Metal Height Features in Electrolysis Process. DCOSS 2019: 312-317 - [c9]Thanasis Vafeiadis, Alexandros Nizamis, Vissarion Pavlopoulos, Luigi Giugliano, Vaia Rousopoulou, Dimosthenis Ioannidis, Dimitrios Tzovaras:
Data Analytics Platform for the Optimization of Waste Management Procedures. DCOSS 2019: 333-338 - [c8]Adamantia Chouliara, Konstantinos Peppas, Apostolos C. Tsolakis, Thanasis Vafeiadis, Stelios Krinidis, Dimitrios Tzovaras:
Occupancy Inference Through Energy Consumption Data: A Smart Home Experiment. ICVS 2019: 670-679 - [c7]Nikolaos Kolokas, Thanasis Vafeiadis, Dimosthenis Ioannidis, Dimitrios Tzovaras:
Anomaly Detection in Aluminium Production with Unsupervised Machine Learning Classifiers. INISTA 2019: 1-6 - [c6]Thanasis Vafeiadis, Alexandros Nizamis, Konstantinos Apostolou, Vasiliki Charisi, Ifigeneia N. Metaxa, Theofilos Mastos, Dimosthenis Ioannidis, Angelos Papadopoulos, Dimitrios Tzovaras:
Intelligent Information Management System for Decision Support: Application in a Lift Manufacturer's Shop Floor. INISTA 2019: 1-6 - 2018
- [c5]Nikolaos Kolokas, Thanasis Vafeiadis, Dimosthenis Ioannidis, Dimitrios Tzovaras:
Forecasting faults of industrial equipment using machine learning classifiers. INISTA 2018: 1-6 - [c4]Anastasios Vafeiadis, Thanasis Vafeiadis, Stelios Zikos, Stelios Krinidis, Konstantinos Votis, Dimitrios Giakoumis, Dimosthenis Ioannidis, Dimitrios Tzovaras, Liming Chen, Raouf Hamzaoui:
Energy-based decision engine for household human activity recognition. PerCom Workshops 2018: 704-709 - 2017
- [c3]Evdoxia Eirini Lithoxoidou, Thanasis Vafeiadis, Stelios Krinidis, Dimosthenis Ioannidis, Dimitrios Tzovaras, Chrysovalantou Ziogou, Spyros Voutetakis:
Malfunction diagnosis in industrial process systems using data mining for knowledge discovery. ICE/ITMC 2017: 454-461 - 2016
- [c2]Thanasis Vafeiadis, Dimosthenis Ioannidis, Stelios Krinidis, Chrysovalantou Ziogou, Spyros Voutetakis, Dimitrios Tzovaras, Spiridon D. Likothanassis:
Real-time incident detection: An approach for two interdependent time series. EUSIPCO 2016: 1418-1422 - [c1]Thanasis Vafeiadis, Stelios Krinidis, Chrysovalantou Ziogou, Dimosthenis Ioannidis, Spyros Voutetakis, Dimitrios Tzovaras:
Robust malfunction diagnosis in process industry time series. INDIN 2016: 111-116 - 2015
- [j4]Thanasis Vafeiadis, Konstantinos I. Diamantaras, George Sarigiannidis, Konstantinos Ch. Chatzisavvas:
A comparison of machine learning techniques for customer churn prediction. Simul. Model. Pract. Theory 55: 1-9 (2015) - 2012
- [j3]Thanasis Vafeiadis, Alexandros Papanikolaou, Christos Ilioudis, Stefanos Charchalakis:
Real-time network data analysis using time series models. Simul. Model. Pract. Theory 29: 173-180 (2012) - 2011
- [j2]Thanasis Vafeiadis, Efthimia Bora-Senta, Dimitris Kugiumtzis:
Estimation of linear trend onset in time series. Simul. Model. Pract. Theory 19(5): 1384-1398 (2011)
2000 – 2009
- 2008
- [j1]Thanasis Vafeiadis, Efthimia Bora-Senta, Dimitris Kugiumtzis:
Evaluation of Linear Trend Tests Using Resampling Techniques. Commun. Stat. Simul. Comput. 37(5): 907-923 (2008)
Coauthor Index
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