Free-viewpoint Sports Video Generation Based on Dynamic NeRF Considering Time Series - Masato Kawai; Rintaro Yanagi; Ren Togo; Takahiro Ogawa; Miki Haseyama (11th IEEE Global Conference on Consumer Electronics, GCCE 2022, Osaka, Japan, October 18-21, 2022, 2022)

Coaxial needle insertion assistant for epidural puncture effect of lateral force on needle - Yoshihiko Koseki; Masato Kawai; Danilo De Lorenzo; Yasushi Yamauchi; Kiyoyuki Chinzei (35th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2013, Osaka, Japan, July 3-7, 2013, 2013)

An Efficient Algorithm for RTL Power Macro-Modeling and Library Building - Masaaki Ohtsuki; Masato Kawai; Masahiro Fukui (IEICE Trans. Electron., 2009)

Scan design at NEC - Shigehiro Funatsu; Masato Kawai; Akihiko Yamada (IEEE Des. Test, 1989)

System Level Fault Dictionary Generation - Hidetoshi Tanaka; Masato Kawai; Izumi Sugasaki; Tadanobu Hakuba (Proceedings International Test Conference 1988, Washington, D.C., USA, September 1988, 1988)

Testing for a Solid-State Color Image Sensor - T. Noguchi; Atsushi Murakami; Masato Kawai; Y. Hayasaka (Proceedings International Test Conference 1986, Washington, D.C., USA, September 1986, 1986)

Test Data Quality Assurance - Masato Kawai; T. Shimono; Shigehiro Funatsu (Proceedings International Test Conference 1986, Washington, D.C., USA, September 1986, 1986)

An Automatic Test-Generation System for Large Digital Circuits - Shigehiro Funatsu; Masato Kawai (IEEE Des. Test, 1985)

An AC/DC Test Generation System for Gate Array LSIs - T. Shimono; K. Oozeki; M. Takahashi; Masato Kawai; Shigehiro Funatsu (Proceedings International Test Conference 1985, Philadelphia, PA, USA, November 1985, 1985)

An experimental MOS fault simulation program CSASIM - Masato Kawai; John P. Hayes (Proceedings of the 21st Design Automation Conference, DAC '84, Albuquerque, New Mexico, June 25-27, 1984, 1984)

A High Level Test Pattern Generation Algorithm - Masato Kawai; Hideo Shibano; Shigehiro Funatsu; Shunichi Kato; T. Kurobe; K. Ookawa; Tohru Sasaki (Proceedings International Test Conference 1983, Philadelphia, PA, USA, October 1983, 1983)

A Calculus of Testability Measure at the Functional Level - Shigeru Takasaki; Masato Kawai; Shigehiro Funatsu; Akihiko Yamada (Proceedings International Test Conference 1981, Philadelphia, PA, USA, October 1981, 1981)