Bundesanstalt für Materialforschung und -prüfung hat dies direkt geteilt
If you are curious about what can be achieved with ellipsometry, please check out our latest paper, available here: https://lnkd.in/dXRWaEzg In this paper, we compare electrical properties derived from spectroscopic ellipsometry with those obtained using complementary metrological tools for nanotechnology applications, aiming to optimize deposition process monitoring for better control of thin film properties. Many thanks to the entire ELENA project team, especially Elena Ermilova and Andreas Hertwig! Bundesanstalt für Materialforschung und -prüfung, #BAMResearch