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A New Built-in Self Test Scheme for Phase-Locked Loops ...
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In this paper, we propose a new PLL BIST (built-in self test) using the distorted frequency detector that uses only internal digital signals. The proposed BIST ...
A New Built-in Self Test Scheme for Phase-Locked Loops Using ...
Harvard University
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Harvard University
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In this paper, we propose a new PLL BIST (built-in self test) using the distorted frequency detector that uses only internal digital signals. The proposed BIST ...
A new built-in self test scheme for phase-locked loops ...
Elsevier
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Elsevier
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由 Y Kim 著作2008被引用 6 次 — In this paper, we propose a new PLL BIST (built-in self test) using the distorted frequency detector that uses only internal digital signals. The proposed BIST ...
[PDF] A New Built-in Self Test Scheme for Phase-Locked Loops ...
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This paper proposes a new PLL BIST (built-in self test) using the distorted frequency detector that uses only internal digital signals and provides an ...
A New Built-in Self Test Scheme for Phase-Locked Loops Using ...
Academia.edu
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In this paper, we propose a new PLL BIST (built-in self test) using the distorted frequency detector that uses only internal digital signals. The proposed BIST ...
A New Built-in Self Test Scheme for Phase-Locked Loops Using ...
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In this paper, we propose a new PLL BIST (built-in self test) using the distorted frequency detector that uses only internal digital signals. The proposed BIST ...
A new built-in self test scheme for phase-locked loops ...
Elsevier
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Elsevier
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Fingerprint. Dive into the research topics of 'A new built-in self test scheme for phase-locked loops using internal digital signals'.
A New Built-in Self Test Scheme for Phase-Locked Loops Using ...
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Bibliographic details on A New Built-in Self Test Scheme for Phase-Locked Loops Using Internal Digital Signals.
A New Built-in Self Test Scheme for Phase-Locked Loops Using ...
Florida Online Journals
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A New Built-in Self Test Scheme for Phase-Locked Loops Using Internal Digital Signals. Authors. Youbean KIM; Kicheol KIM; Incheol KIM; Sungho KANG. Downloads.
Built-In Self-Test Scheme for All-Digital Phase-Locked Loops
ResearchGate
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ResearchGate
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2024年10月22日 — This paper presents a low-cost Built-In Self-Test (BIST) scheme, which is based on the principle of parity check code.