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A Test Structure for the EMC Characterization of Small ...
IEEE Xplore
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由 M Perotti 著作2018被引用 10 次 — This paper deals with the measurement methods used to evaluate the electromagnetic (EM) emission of integrated circuits (ICs) as well as ...
A Test Structure for the EMC Characterization of Small ...
IEEE Xplore
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由 M Perotti 著作2018被引用 10 次 — Abstract—This paper deals with the measurement methods used to evaluate the electromagnetic (EM) emission of integrated circuits (ICs) as well as their ...
A Test Structure for the EMC Characterization of Small ...
ResearchGate
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ResearchGate
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This paper deals with the measurement methods used to evaluate the electromagnetic (EM) emission of integrated circuits (ICs) as well as their ...
EMC - PEIC Power Electronics Innovation Center
Politecnico di Torino
https://www.peic.polito.it › publications
Politecnico di Torino
https://www.peic.polito.it › publications
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Perotti, F. Fiori, "A Test Structure for the EMC Characterization of Small Integrated Circuits, IEEE Trans. on Instrum and Measurement", pp. 9, 2018, ...
Integrated Circuits (ICs) & Component EMC Testing
AR RF/Microwave Instrumentation
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AR RF/Microwave Instrumentation
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The test board controls the geometry and orientation of the EUT relative to the cell and eliminates any connecting leads within the cell. Rotating the test ...
Technology Trends and Electromagnetic Compatibility of ...
Archive ouverte HAL
https://hal.science › hal-02321017 › file › EMCC...
Archive ouverte HAL
https://hal.science › hal-02321017 › file › EMCC...
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由 E Sicard 著作2019被引用 10 次 — A Test Structure for the EMC Characterization of Small Integrated Circuits, Michele Perotti,. 2019. •. Stripline method adaptation to very small ICs. EMC ...
Characterization of an EMC test-chip
ResearchGate
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ResearchGate
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A test-chip is developed with the aim to evaluate on-chip measures to ultimately improve the EMC behavior of ICs in their final applications.
Impact of Technological Trends and Electromagnetic ...
Archive ouverte HAL
https://hal.science › hal-02403882 › file › EMCo...
Archive ouverte HAL
https://hal.science › hal-02403882 › file › EMCo...
PDF
由 E Sicard 著作2019被引用 10 次 — Fiori, A Test Structure for the EMC Characterization of Small Integrated Circuits, IEEE Trans. on. Instrumentation and Measurement, vol. 67 ...
20 頁
A methodology for testing immunity of field programmable ...
ScienceDirect.com
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ScienceDirect.com
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由 A Baccigalupi 著作2011被引用 9 次 — A test structure for the EMC characterization of small integrated circuits. 2018, IEEE Transactions on Instrumentation and Measurement. A low-cost device for ...
A Novel IC-Stripline Cell Design Based on Image Theory
MDPI
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MDPI
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由 L Chen 著作2022被引用 4 次 — The IC-Stripline cell is the equipment used to measure radiated emission and immunity of the IC. Before using it to measure, the IC should be mounted on a ...
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