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CNN-Based Stochastic Regression for IDDQ Outlier ...
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由 CH Yen 著作2023被引用 10 次 — In article, an improved convolutional neural network (CNN)-based method can be proposed for IDDQ outlier identification. In the proposed method ...
CNN-based Stochastic Regression for IDDQ Outlier ...
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由 CT Chen 著作2020被引用 10 次 — The proposed stochastic regression model is obtained by training a convolutional neural network (CNN) and, based on its primitive property of convolutional ...
CNN-based Stochastic Regression for IDDQ Outlier ...
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由 CT Chen 著作2020被引用 10 次 — In this paper, by employing a stochastic regression model, the mean as well as the variance of the IDDQ of a die under test (DUT) can be predicted.
CNN-based Stochastic Regression for IDDQ Outlier ...
國立陽明交通大學
https://scholar.nycu.edu.tw › publications › cnn-based-st...
國立陽明交通大學
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In order to reduce DPPM (defect parts per million), IDDQ testing methodology can be exploited for identifying "outliers" which are potentially defective but ...
CNN-based Stochastic Regression for IDDQ Outlier ...
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CNN-based Stochastic Regression for IDDQ Outlier Identification Volume 120 of 資訊科學與工程研究所(交大) - 碩士論文; 2019. Author, 陳均騰. Publisher, 國立交通 ...
Shu-Yi Kao
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2024年4月25日 — CNN-Based Stochastic Regression for IDDQ Outlier Identification. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42(11): 4282-4295 ...
Chun-Teng Chen's research works | National Chiao Tung ...
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In article, an improved convolutional neural network (CNN)-based method can be proposed for IDDQ outlier identification. In the proposed method, the mean and ...
Chia-Heng Yen - Google 學術搜尋
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CNN-based stochastic regression for IDDQ outlier identification. CH Yen, CT ... Using Path Features for Hardware Trojan Detection Based on Machine Learning ...
Kai-Chiang Wu
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2024年12月11日 — CNN-Based Stochastic Regression for IDDQ Outlier Identification. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42(11): 4282-4295 ...
Statistical outlier screening as a test solution health monitor
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CNN-based Stochastic Regression for IDDQ Outlier Identification · Engineering, Computer Science. 2020 IEEE 38th VLSI Test Symposium (VTS) · 2020.