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Design-for-testability for multi-cycle broadside tests by holding ...
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由 I Pomeranz 著作2014被引用 7 次 — This article describes a design-for-testability approach for increasing the transition fault coverage of multi-cycle broadside tests.
Design-for-testability for multi-cycle broadside tests by holding of ...
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This article describes a design-for-testability approach for increasing the transition fault coverage of multi- cycle broadside tests.
Design-for-testability for multi-cycle broadside tests by holding of ...
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A design-for-testability approach based on holding the values of selected state variables constant during the functional clock cycles of a multi-cycle ...
ACM Transactions on Design Automation of Electronic ...
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2024年10月25日 — Irith Pomeranz: Design-for-testability for multi-cycle broadside tests by holding of state variables ...
Generation of Multi-Cycle Broadside Tests - R Discovery
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2011年8月1日 — Design-for-testability for multi-cycle broadside tests by holding of state variables. Irith Pomeranz. ACM Transactions on Design Automation of ...
A Multi-Cycle Test Set Based on a Two- ...
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Design-for-Testability for Multi-Cycle Broadside Tests by Holding of State Variables. Article. Mar 2014. Irith Pomeranz. This article describes a design-for ...
Built-In Generation of Functional Broadside Tests Using a ...
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2024年10月22日 — This paper shows that on-chip generation of functional broadside tests can be done using a simple and fixed hardware structure, with a small ...
Built-In Generation of Functional Broadside Tests Using a ...
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This paper shows that on-chip generation of functional broadside tests can be done using a simple and fixed hardware structure, with a small number of ...
Multi‐cycle broadside tests with runs of constant primary input ...
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由 I Pomeranz 著作2014被引用 4 次 — A functional clock cycle between the scan operations of a multi-cycle test defines an input pattern to the combinational logic of the circuit.
On the use of multi-cycle tests for storage of two-cycle broadside ...
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This paper describes a new approach that stores multi-cycle tests, but applies to the circuit tests that are effectively two-cycle broadside tests. The storage ...