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Distributed-based Hierarchical Clustering System for Large ...
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由 S Lee 著作2018被引用 9 次 — Abstract: In this paper, we propose a Distributed-based Hierarchical Clustering System for Large-Scale Semiconductor Wafers (DHCSSW).
Distributed-based Hierarchical Clustering System for Large ...
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The experimental results show that the proposed Distributed-based Hierarchical Clustering System for Large-Scale Semiconductor Wafers outperformed the ...
Distributed-based Hierarchical Clustering System for Large ...
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由 S Lee 著作2018被引用 9 次 — The experimental results show that our system outperformed the existing hierarchical clustering in processing large-scale wafers, suggesting that currently used.
Distributed-based Hierarchical Clustering System for Large- ...
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We report the first demonstration of photoconductivity of a polymer film doped with nanometer-sized semiconductor clusters (quantum dots). In such a composite, ...
Distributed-based Hierarchical Clustering System for Large- ...
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Distributed-based Hierarchical Clustering System for Large-scale Semiconductor Wafers. Seungchul Lee, Daeyoung Kim. Distributed-based Hierarchical Clustering ...
ICI Journals Master List
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8. Lee, S. ve Kim, D. (2018), “Distributed-based hierarchical clustering system for large-scale semiconductor wafers”, International Conference on Industrial ...
Toshiba, SanDisk ramping 43nm NAND flash with HK+MG, 3b/cell
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The experimental results show that the proposed Distributed-based Hierarchical Clustering System for Large-Scale Semiconductor Wafers outperformed the ...
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Improved Wafer Map Inspection Using Attention ...
MDPI
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由 Q Xu 著作2022被引用 21 次 — Distributed-based hierarchical clustering system for large-scale semiconductor wafers. In Proceedings of the 2018 IEEE International ...
Wafer bin map inspection based on DenseNet
Springer
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由 N Yu 著作2021被引用 10 次 — Wafer bin map (WBM) inspection is a critical approach for evaluating the semiconductor manufacturing process.
Distributed Hierarchical Distribution Control for Very-Large- ...
arXiv
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由 AD Saravanos 著作2023被引用 9 次 — This paper considers a class of systems labeled as Very-Large-Scale Multi-Agent Systems (VLMAS) with dimensionality that can scale up to the order of millions ...
缺少字詞： Semiconductor Wafers.
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