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Dynamic test set generation for analog circuits and systems
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In this paper, we present an approach to construct a set of dynamic test signals for analog circuits and systems. Testability transfer factors are ...
Dynamic test set generation for analog circuits and systems
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In this paper, we present an approach to construct a set of dynamic test signals for analog circuits and systems. Testability transfer factors are ...
Dynamic Test Set Generation for Analog Circuits and ...
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由 S Huynh 著作1998被引用 5 次 — In this paper, we present an apporach to construct a set of dynamic test signals for analog circuits and systems. Testability transfer factors are ...
Dynamic test set generation for analog circuits and systems
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Dynamic test set generation for analog circuits and systems. Huynh S., Seongwon Kim, Soma M., Jinyan Zhang. Expand. Publication type: Proceedings Article.
Dynamic Test Set Generation for Analog Circuits and Systems.
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Bibliographic details on Dynamic Test Set Generation for Analog Circuits and Systems.
Sam D. Huynh
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2024年4月25日 — Efficient Test Set Design for Analog and Mixed-Signal Circuits and Systems. ... Dynamic Test Set Generation for Analog Circuits and Systems. Asian ...
Test Generation for Analog and Mixed-Signal Circuits ...
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2024年11月2日 — PDF | In this paper we propose an approach for testing time-domain properties of analog and mixed-signal circuits.
[PDF] Dynamic test signal design for analog ICs
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Dynamic test set generation for analog circuits and systems · Current-based testing for analog and mixed-signal circuits · Automatic analog test signal generation ...
(PDF) Test pattern generation for analog circuits using ...
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2024年10月22日 — This paper presents a comparative analysis of neural networks, simulated annealing, and genetic algorithms in the determination of input ...
Efficient Test Set Design for Analog and Mixed-Signal Circuits and ...
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This paper presents a novel test set compaction algorithm which takes a generated test set and maximally reduces the number of test vectors required while ...