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Efficient Identification of Undetectable Two-Cycle Gate ...
IEEE Xplore
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Efficient Identification of Undetectable Two-Cycle Gate- ...
IEEE Xplore
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IEEE Xplore
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由 I Pomeranz 著作2021被引用 4 次 — As a superset of cell-aware faults, gate-exhaustive faults provide a target for the generation of a comprehensive test set.
Irith Pomeranz
DBLP
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Irith Pomeranz: Iterative Test Generation for Gate-Exhaustive Faults to Cover the Sites of Undetectable Target Faults ...
Iterative Test Generation for Gate-Exhaustive Faults to ...
National Science Foundation (.gov)
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National Science Foundation (.gov)
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由 I Pomeranz 著作2019被引用 6 次 — To cover undetectable delay faults, two-cycle gate input patterns should be considered as gate-exhaustive faults. Undetectable single stuck-at faults exist ...
Wrapping Paths of Undetected Transition Faults With Two-Cycle ...
ResearchGate
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The goal of this article is to provide additional coverage for paths of undetected transition faults by using two-cycle gate-exhaustive faults for subcircuits ( ...
Bibliographies: 'Gate-exhaustive faults'
Grafiati
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Pomeranz, Irith. "Efficient Identification of Undetectable Two-Cycle Gate-Exhaustive Faults." IEEE Transactions on Computer-Aided Design of Integrated Circuits ...
ATPG and compression by using majority gates
Google Patents
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Google Patents
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Using such a device, an exhaustive test can be done by applying 2 N input patterns to a design with N inputs and scan cells, wherein N is a positive integer.
Increasing the Fault Coverage of a Truncated Test Set
ACM Digital Library
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ACM Digital Library
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由 I Pomeranz 著作2022 — To define two-cycle gate-exhaustive faults, the gate and input pattern from every single-cycle gate-exhaustive fault is used for the second pattern of one or ...
[PDF] Gate exhaustive testing
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Gate exhaustive test sets are more efficient than single stuck-at and N-detect test sets in terms of the ability to detect defective chips and test length.
Maximal Independent Fault Set for Gate-Exhaustive Faults
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Gate-exhaustive faults have certain properties that can be used in the computation of independent fault sets that provide a lower bound on the number of ...