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Elements of Computational Metrology
DIMACS (Rutgers)
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DIMACS (Rutgers)
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由 V Srinivasan 著作被引用 11 次 — It deals with fitting and filtering discrete geometric data that are obtained by measurements made on manufactured parts. It plays an important role in ...
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Elements of Computational Metrology
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In this paper, it is explained how this association process of a datum may be applied to planes and cylinders, used as single datum, datum systems, ...
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Elements of Computational Metrology
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2024年8月19日 — Delve into the world of computational metrology, focusing on geometric measurements, fitting, and filtering methodologies.
Computational Metrology
National Institute of Standards and Technology (.gov)
https://www.nist.gov › publications › c...
National Institute of Standards and Technology (.gov)
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由 T Hopp 著作1993被引用 108 次 — By computational metrology we mean the study of how data analysis factors affect the measurement uncertainty of a CMS.
COMPUTATIONAL METROLOGY1 - Theodore H. Hopp ...
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由 TH Hopp 著作1993被引用 108 次 — Factors affecting software performance include the choice of analysis method, the quality of the software, and characteristics of the specific measurement task.
Computational metrology based correction and control
Google Patents
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Google Patents
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Described herein is a method for determining correction to a patterning process. The method includes obtaining a plurality of qualities of the patterning ...
Computational Metrology for the Design and Manufacture ...
ResearchGate
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2024年12月5日 — Collectively, they define the field of computational metrology for the design specification, production, and verification of product geometry.
Computational Metrology: Problems and Solution Methods
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2024年10月22日 — Computational metrology is referred to as a measurement method where a complicated measurement process is modeled as a forward problem and ...
Computational Metrology for Measuring Industrial ...
IJMEMS
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IJMEMS
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The aim of this paper is to utilize computer vision detection algorithms to control the quality of manufactured parts by sorting them on size tolerance. The ...
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The future of metrology is powered by algorithms - Stories
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2020年6月29日 — ASML Fellow Arie den Boef developed YieldStar metrology and is now pioneering smart algorithms in imaging.
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