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有關 Enhanced testing performance via unbiased test sets. 的學術文章
Enhanced testing performance via unbiased test sets - ‎Wang - 3 個引述

Enhanced testing performance via unbiased test sets

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The test generation task involves two separate questions which are: (1) What should the next test be? and (2) Have enough tests been selected to achieve an ...

Enhanced Testing Performance via Unbiased Test Sets

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由 LC Wang 著作被引用 3 次 — For very large circuits, we show that an unbiased test set is more likely to be better than the set from explicit fault models. In addition to the probabilistic ...

Enhanced testing performance via unbiased test sets

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The test generation task involves two separate questions which are: (1) What should the next test be? and (2) Have enough tests been selected to achieve an ...

Enhanced testing performance via unbiased test sets | Proceedings ...

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In this paper, we propose the use of independent models for answers to the two questions above, and we show, via probabilistic analysis as well as experiments, ...

Enhanced testing performance via unbiased test sets | CoLab

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Enhanced testing performance via unbiased test sets ; I DDQ testing as a component of a test suite: The need for several fault coverage metrics. Maxwell P.C., ...

dblp: Enhanced testing performance via unbiased test sets.

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Bibliographic details on Enhanced testing performance via unbiased test sets.

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Enhanced testing performance via unbiased test sets · pdf icon · hmtl icon · Li-C. Wang, M. Ray Mercer, Thomas W. Williams. Published: 31 Dec 1994, Last ...

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Compact test sets for high defect coverage

Semantic Scholar

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This work reports on test pattern generators for combinational circuits that generate test sets to detect each single line stuck-at fault a given number of ...