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Fault diagnosis aware ATE assisted test response ...
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由 JM Howard 著作2011被引用 4 次 — Abstract: Recently a new method called ATE assisted compaction for achieving test response compaction has been proposed. The method relies on testers to achieve ...
Fault Diagnosis Aware ATE Assisted Test Response ...
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由 I Pomeranz 著作 — To make the results on compaction and diagnosis realistic we inject unspecified values in to tests. The unspecified values are randomly set by leaving randomly ...
Fault diagnosis aware ATE assisted test response compaction
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Abstract - Recently a new method called ATE assisted compaction for achieving test response compaction has been proposed. The method relies on testers to ...
Fault diagnosis aware ATE assisted test response compaction
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Recently a new method called ATE assisted compaction for achieving test response compaction has been proposed. The method relies on testers to achieve ...
Fault diagnosis aware ATE assisted test response compaction
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Experimental results on larger ISCAS-89 show that additional test response compaction can be achieved while diagnostic resolution for single and double ...
Fault diagnosis aware ATE assisted test response compaction ...
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Recently a new method called ATE assisted compaction for achieving test response compaction has been proposed. The method relies on testers to achieve ...
Fault diagnosis aware ATE assisted test response compaction.
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J. M. Howard, Sudhakar M. Reddy, Irith Pomeranz, Bernd Becker : Fault diagnosis aware ATE assisted test response compaction. ASP-DAC 2011: 812-817.
ATE Assisted Test Response Compaction | Request PDF
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A new method for achieving test response compaction is proposed. The method involves testers to achieve additional compaction, without compromising fault ...
ATE assisted test response compaction
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A new method for achieving test response compaction, which does not add additional logic or modify the circuit under test or require additional tests and ...
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A diagnosis algorithm for extreme space compaction | Proceedings ...
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During volume testing, test application time, test data volume and high performance automatic test equipment (ATE) are the major cost factors.
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