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Identification of in-field defect development in digital image ...
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由 J Dudas 著作2007被引用 51 次 — We report on and algorithm and calibration tests, which confirmed the existence of significant quantities of in-field defects in 4 out of 5 high-end digital ...
Identification of in-field defect development in digital image ...
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2024年10月22日 — We report on and algorithm and calibration tests, which confirmed the existence of significant quantities of in-field defects in 4 out of 5 high ...
Identification of in-field defect development in digital image ...
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Although solid-state image sensors are known to develop defects in the field, little information is available about the nature, quantity or development rate ...
Identification of In-Field Sensor Defects in the Context of ...
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由 R Jöchl 著作2021被引用 5 次 — Available age approximation methods based on the presence of in-field sensor defects. Fridrich et al. proposed a maximum likelihood approach for image age.
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Identification of in-field defect development in digital image sensors. J Dudas, LM Wu, C Jung, GH Chapman, Z Koren, I Koren. Digital Photography III 6502 ...
Automatic Detection of In-field Defect Growth in Image ...
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Characterization of pixel defect development during digital imager lifetime · Identification of in-field defect development in digital image sensors.
On-Line Mapping of In-Field Defects in Image Sensor Arrays
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由 J Dudas 著作2006被引用 19 次 — Continued increase in complexity of digital image sensors means that defects are more likely to develop in the field, but little concrete information is ...
Quantitative Analysis of In-Field Defects in Image Sensor ...
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由 J Leung 著作2007被引用 53 次 — Growth of pixel density and sensor array size increases the likelihood of developing in-field pixel defects. An ongoing study on defect development in ...
[PDF] Statistical identification and analysis of defect development ...
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Characterization of pixel defect development during digital imager lifetime · Automatic Detection of In-field Defect Growth in Image Sensors · Quantitative ...
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<title>Statistical identification and analysis of defect development ...
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Instead, high radiation appears to accelerate defect development in image sensors. It is important to detect these faulty pixels prior to the use of image ...
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