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Input pattern classification for transistor level testing of ...
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由 SM Menon 著作1996 — This paper presents the effects of bridging faults affecting p- or n-parts and input bridging faults of logical nodes affecting p- and n-parts. It is shown that ...
Input pattern classification for transistor level testing of BiCMOS ...
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In BiCMOS, transistor stuck-OPEN faults exhibit delay faults in addition to sequential behavior. Stuck-ON faults cause enhanced I/sub DDQ/.
Input pattern classification for transistor level testing of BiCMOS ...
Semantic Scholar
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The faulty behavior of Bipolar (TTL) and CMOS logic families is compared with BiCMOS and an input pattern classification scheme is presented for different ...
Input pattern classification for transistor level testing of BiCMOS ...
Academia.edu
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With this design, only a single vector is required to test for a fault instead of the twopattern or multipattern sequences. The testable design scheme presented ...
(PDF) Input Pattern Classification for Transistor Level Testing of ...
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Input Pattern Classification for Transistor Level Testing of Bridging Faults in BiCMOS Circuits ... Testable design for BiCMOS stuck-open fault detection.
Input Pattern Classification for Transistor Level Testing of Bridging ...
ACM Digital Library
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This paper presents effects of bridging faults affecting p-and n-parts. It is shown that bridging faults can be detected by IDDQ monitoring in BiCMOS devices.
of Bridging Faults in BiCMOS Circuits
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由 AP Jayasumana 著作 — An input pattern classification scheme is presented for bridging faults. These classes of input patterns are then used to obtain test sets for bridging fault ...
Input pattern classification for transistor level testing of bridging ...
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It is shown that bridging faults can be detected by I/sub DDQ/ monitoring in BiCMOS devices and an input pattern classification scheme is presented for ...
Input pattern classification for transistor level testing ... - CoLab
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Input pattern classification for transistor level testing of bridging faults in BiCMOS circuits. Menon S.M., Jayasumana A.P., Malaiya Y.K..
Technical Reports – Department of Computer Science
Colorado State University
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Colorado State University
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PS PDF “Input Pattern Classification for Transistor Level Testing of BiCMOS Circuits*” Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya. 94-107. PS ...