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On generating pseudo-functional delay fault tests for scan ...
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由 Z Zhang 著作2005被引用 110 次 — Abstract: In designs using DFT, such as scan, some of the faults that are untestable in the circuit without DFT become testable after DFT insertion.
On Generating Pseudo-Functional Delay Fault Tests for Scan ...
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由 Z Zhang 著作2006被引用 47 次 — In this section we briefly review the launch off capture test method for delay faults and scan chain segmentation to reduce power dissipation during test. For ...
On Generating Pseudo-Functional Delay Fault Tests for ...
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由 Z Zhang 著作2005被引用 110 次 — In designs using DFT such as scan some of the faults that are untestable in the circuit without DFT become testable after DFT insertion.
On Generating Pseudo-Functional Delay Fault Tests for Scan Designs
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In designs using DFT such as scan some of the faults that are untestable in the circuit without DFT become testable after DFT insertion.
On generating pseudo-functional delay fault tests for scan designs
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Abstract: In designs using DFT, such as scan, some of the faults that are untestable in the circuit without DFT become testable after DFT insertion.
Compression-Aware Pseudo-Functional Testing - CUHK CSE
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由 F Yuan 著作被引用 6 次 — On Generate Pseudo-Functional. Delay Fault Tests for Scan Designs. In Proc. IEEE International Sym- posium on Defect and Fault Tolerance in VLSI Systems (DFT), ...
Constraint Extraction for Pseudo-Functional Scan-based ...
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由 YC Lin 著作被引用 128 次 — This paper presents a pseudo-functional test methodology that attempts to minimize the over-testing problem of the scan-based circuits for the delay faults. The ...
Pseudo-functional scan-based BIST for delay fault
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Constraint extraction for pseudo-functional scan-based delay testing · Bit-fixing in pseudorandom sequences for scan BIST · Robust delay-fault test generation and ...
Constraint extraction for pseudo-functional scan-based delay ...
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由 YC Lin 著作2005被引用 128 次 — This paper presents a pseudo-functional test methodology that attempts to minimize the over-testing problem of the scan-based circuits for the delay faults. The ...
Zhuo Zhang's research works | University of Iowa and other ...
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Two methods to apply tests to detect delay faults in standard scan designs are used. One is called launch off capture and the other is called launch off shift.