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Robust and low-cost BIST architectures for sequential fault ...
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In this paper, we present two BIST architectures for modified Booth array multipliers with respect to the Realistic Sequential Cell Fault model (RS-CFM). The ...
Robust and low-cost BIST architectures for sequential fault ...
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由 M Psarakis 著作2001被引用 5 次 — In this paper, we consider for first time the problem of robust sequential fault testing of signed and recoded, array multipliers. The problem of sequential ...
Robust and Low-Cost BIST Architectures for Sequential Fault ...
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The modified Booth array multiplier is the most ubiquitous multiplier architecture in the datapaths of either general purpose microprocessors or specialized ...
Robust and Low-Cost BIST Architectures for Sequential ...
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由 M Psarakis 著作2001被引用 5 次 — In this paper, we present two BIST architectures for modified Booth array multipliers with respect to the Realistic Sequential Cell Fault model (RS-CFM). The ...
Robust and Low-Cost BIST Architectures for Sequential Fault ...
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In this paper, we present two BIST architectures for modified Booth array multipliers with respect to the Realistic Sequential Cell Fault model (RS-CFM). The ...
Robust and low-cost BIST architectures for sequential fault ...
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Two BIST architectures for modified Booth array multipliers with respect to the Realistic Sequential Cell Fault model are presented and offer a universal ...
Psarakis: Robust and low-cost BIST architectures... - Academic Search
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The modified Booth array multiplier is the most ubiquitous multiplier architecture in the datapaths of either general purpose microprocessors or specialized ...
Proceedings 19th IEEE VLSI Test Symposium. VTS 2001
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Robust and Low-Cost BIST Architectures for Sequential Fault Testing in Datapath Multipliers pp. ... SPIRIT: A Highly Robust Combinational Test Generation ...
Effective low power BIST for datapaths (poster paper)
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Related papers. Robust and low-cost BIST architectures for sequential fault testing in datapath multipliers · Yervant Zorian. Proceedings 19th IEEE VLSI Test ...
Nektarios Kranitis
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2024年9月10日 — A Low-Cost SEU Fault Emulation Platform ... Robust and Low-Cost BIST Architectures for Sequential Fault Testing in Datapath Multipliers.