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Subsets of Primary Input Vectors in Sequential Test ...
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由 I Pomeranz 著作2011被引用 5 次 — This paper studies the possibility of reducing the complexity of deterministic sequential test generation by using subsets of primary input ...
Subsets of Primary Input Vectors in Sequential Test ...
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2024年10月22日 — This paper studies the possibility of reducing the complexity of deterministic sequential test generation by using subsets of primary input vectors of limited ...
Subsets of Primary Input Vectors in Sequential Test Generation ...
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POMERANZ: SUBSETS OF PRIMARY INPUT VECTORS IN SEQUENTIAL TEST GENERATION FOR SINGLE STUCK-AT FAULTS. 1581. The procedure considers N = 1, 2, ... , NMAX and P ...
Gate-Level Test Generation for Sequential Circuits
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由 KT CHENG 著作1996被引用 35 次 — This paper discusses the gate-level automatic test pattern generation (ATPG) methods and techniques for sequential circuits. The basic concepts, examples, ...
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TOV: Sequential Test Generation by Ordering of Test Vectors
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Subsets of Primary Input Vectors in Sequential Test Generation for Single Stuck-at Faults · Reconstruction of a functional test sequence for increased fault ...
Primary Input Vectors to Avoid in Random Test Sequences ...
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Subsets of Primary Input Vectors in Sequential Test Generation for Single Stuck-at Faults. Authors. I. Pomeranz. Source Information. October 2011, Volume30 ...
Primary input cones based on test sequences in ...
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由 I Pomeranz 著作2011被引用 1 次 — The authors also discuss properties of the subsets of primary inputs that are useful in detecting target faults when their values are specified.
Test Generation for Highly Sequential Circuits - DTIC
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If the fault is not propa- gated to the primary outputs, then another sequence of input vectors is necessary to propagate the fault to the primary outputs. Thus ...
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FDPIC: Generation of Functional Test Sequences Based on Fault ...
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This paper introduces an approach for a fault-dependent computation of c that allows the test generation procedure to generate test subsequences that match ...
Chapter 3 TEST GENERATION TECHNIQUES AND ...
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Abstract: This chapter describes different approaches to test generation, fault simulation and fault diagnosis in digital circuits and systems.