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Testable design of BiCMOS circuits for stuck-open fault ...
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由 SM Menon 著作1995 — Testable design of BiCMOS circuits for stuck-open fault detection using single patterns. Abstract: Single BJT BiCMOS devices exhibit sequential behavior ...
Testable design of BiCMOS circuits for stuck-open fault ...
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由 SM Menon 著作1995 — In this paper, we first examine the operation of S-BJT. BiCMOS NAND device under s-OPEN faults. A testable scheme is proposed to detect s-OPEN failures in S-BJT.
Testable design of BiCMOS circuits for stuck-open fault detection ...
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A new design for testability scheme is presented that uses only two extra transistors to improve the circuit testability regardless of timing skews/delays, ...
Testable design for BiCMOS stuck-open fault detection
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Testable design of BiCMOS circuits for stuck-open fault detection using single patterns · Sankaran Menon. IEEE Journal of Solid-State Circuits, 1995. download ...
Design of CMOS circuits for stuck-open fault testability
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2024年10月22日 — The proposed design is highly testable and ensures the detection of s-open faults while a single test vector is used during testing. These tests ...
[PDF] Design of CMOS circuits for stuck-open fault testability
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Testable design of BiCMOS circuits for stuck-open fault detection using single patterns · Computer Science, Engineering. IEEE J. Solid State Circuits · 1995.
Testing and Testable Design of ICs
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Rajsuman, "Testable Design of BiCMOS Circuits for Stuck-Open Fault Detection using Single Patterns," IEEE Journal of Solid State Circuits, vol. 30, No. 8 ...
(PDF) Test generation for BiCMOS circuits | Sankaran Menon
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Testable design of BiCMOS circuits for stuck-open fault detection using single patterns · Sankaran Menon. IEEE Journal of Solid-State Circuits, 1995. download ...
Sankaran M. Menon
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2024年4月25日 — Testable design of BiCMOS circuits for stuck-open fault detection using single patterns. IEEE J. Solid State Circuits 30(8): 855-863 (1995).
