[en] A device for measuring the profile and position of a charged particle beam, comprising an ionization chamber with parallel measuring and high-voltage electrodes, is suggested. The purpose of the invention is to improve the spatial resolution of the device. This purpose is attained in that the measuring electrode is in the form of a filament movable in the plane normal to the beam. Behind the filament, in the direction of the beam and parallel to the chamber electrodes, an additional electrode is placed whose potential should be close to that of the measuring electrode. The suggested device enables one to obtain non-discrete data on the beam