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[en] The effect of annealing on the resistivity of the amorphous Ag-Te films has been studied along with the temperature variation of the resistance of annealed Ag-Te films and the results are interpreted on the basis of phase transformation. (author)
Journal
Physica Status Solidi. A, Applied Research; ISSN 0031-8965; 
; v. 49(2); p. K213-K215
; v. 49(2); p. K213-K215