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AbstractAbstract
[en] A method is presented which uses the backscattered yield from thin calibrated foils for monitoring MeV ion beam doses. It is totally independent of the target and permits ion beam doses to be obtained without the necessity of measuring the ion current. The effect of ion species, beam energy and current and carbon build-up have been investigated to determine their effect on the backscattered yield from and stability of the calibrated foils. (orig.)
Source
4. international conference on ion beam analysis; Aarhus, Denmark; 25 - 29 Jun 1979
Record Type
Journal Article
Literature Type
Conference
Journal
Nuclear Instruments and Methods; ISSN 0029-554X; ; v. 168(1-3); p. 233-240
Country of publication
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INIS VolumeINIS Volume
INIS IssueINIS Issue