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AbstractAbstract
[en] The intensity of the X-ray thermal scattering on the crystallographic (002) and (200) planes of the hexagonal CdSe has been measured in the range 93-293 K. The one and two phonon scattering intensities at 293 have been found according to the temperature dependence. The distribution of the mean square displacements of the longitudinal and perpendicular CdSe lattice vibrations in Brillouin zone along the c axis of the third order and in the plane (a, b) which is perpendicular to c, has been determined using the absolute intensity of the one-phonon scattering. The characteristic temperatures and mean square displacements of the CdSe lattice for thermal vibrations along and across the main c axis of the lattice are shown to be 138, 186 K, and 0.0269, 0.0201 nanometer, respectively. An agreement with the values, obtained using the intensity of the coherent scattering, has been observed
[ru]
Original Title
Opredelenie kharakteristicheskoj temperatury i srednekvadratichnykh smeshenij reshetki CdSe po teplovomu rasseyaniyu rentgenovskikh luchej
Record Type
Journal Article
Journal
Lietuvos Fizikos Rinkinys; ISSN 0024-2969; ; v. 21(5); p. 87-94
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