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AbstractAbstract
[en] The silicon chip is mounted on a ceramic substrate and connected to the preamplifiers via kapton foils. A test bench is constructed, which enables measurement of reverse current and capacitance of all strips simultaneously. (orig.)
Source
2. European symposium on semiconductor detectors: New developments in silicon detectors; Muenchen (Germany, F.R.); 14-16 Nov 1983; CODEN: NIMRD.
Record Type
Journal Article
Literature Type
Conference
Journal
Nuclear Instruments and Methods in Physics Research; ISSN 0167-5087; ; v. 226(1); p. 63-67
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Reference NumberReference Number
INIS VolumeINIS Volume
INIS IssueINIS Issue