Filters
Results 1 - 1 of 1
Results 1 - 1 of 1.
Search took: 0.026 seconds
[en] It is suggested to use multilayer scintillation detector as X-ray exposure meter. Calculation technique for detector parameters, which corresponds to sensitivity of X-ray film, is presented. Calculation results for parameters of three-layer X-exposure meter, which spectral characteristic differs from spectral sensitivity of X-ray film by ≤11% within 20-240 keV energy range, are given
Journal
