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Eberspacher, C.; Ermer, J.H.; Mitchell, K.W.
Atlantic Richfield Co., Los Angeles, CA (United States)1991
Atlantic Richfield Co., Los Angeles, CA (United States)1991
AbstractAbstract
[en] This paper describes a semiconducting thin film forced on a substrate by the method. It comprises: depositing a composite film of copper and indium on a substrate, the film having an atomic copper to indium ratio of about one, depositing a film of selenium on the composite copper indium film, the selenium film thickness selected to provide an atomic ratio of selenium to copper and indium of less than one, and heating the substrate with the composite copper indium film and the selenium film in the presence of H2S gas for a time and at a temperature sufficient to cause interdiffusion of copper, indium, selenium and sulfur to form a semiconductor of the class CuInSe2-xSx where x is less than two
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Source
3 Sep 1991; 17 Nov 1988; vp; US PATENT DOCUMENT 5,045,409/A/; Patent and Trademark Office, Box 9, Washington, DC 20232 (United States); ?: 17 Nov 1988
Record Type
Patent
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