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Shchagin, A.V.; Pristupa, V.I.; Khizhnyak, N.A.
AN Ukrainskoj SSR, Kharkov (Ukraine). Fiziko-Tekhnicheskij Inst1993
AN Ukrainskoj SSR, Kharkov (Ukraine). Fiziko-Tekhnicheskij Inst1993
AbstractAbstract
[en] The results of measurements of absolute differential yield of parametric X-ray radiation (PXR) in thin single crystal are presented for the first time. It has been established that the experimental results are in good agreement with theoretical calculations according with kinematical theory. The influence of density effect on PXR properties is discussed. (author). 19 refs., 7 figs
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1993; 18 p
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