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AbstractAbstract
[en] Investigation results of the NPP ionizing radiation effect on semiconductor instruments and radio electronic equipment are described. The main attention is paid to the radiation effects in MIS structures and dielectrics. Calculational-experimental methods for forecasting failure of integral circuits under ionizing radiation effect are proposed
Original Title
Voprosy atomnoj nauki i tekhniki. Nauchno-tekhnicheskij sbornik
Source
Fizika radiatsionnogo vozdejstviya na radioehlektronnuyu apparaturu; (no.1-2); 1994; 142 p; TsNII Upravleniya, Ehkonomiki i Informatsii; Moscow (Russian Federation)
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Miscellaneous
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