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[en] The principle and operational procedure of Integrated Circuits (ICs) screening with irradiation-and-anneal and multicomponent regression analysis are discussed. The key technology, advantages and shortcomings of the two methods are described in contrast, and some advices are given with the state-of-the-art of the screening technology
Source
China Nuclear Science and Technology Report; v. 1(4); 2002; 8 p; CAEP--0106; ISSN 1671-7430; 
; Data (CD) in PDF format: Acrobat Reader for Windows 9x; This article is located on p. 15-22; 1 fig., 4 refs.
; Data (CD) in PDF format: Acrobat Reader for Windows 9x; This article is located on p. 15-22; 1 fig., 4 refs.