[en] We report a systematic study of Pr_0.5Sr_0.5MnO₃ epitaxial thin films grown on (100)-LaAlO₃ single-crystal substrates using the pulsed laser deposition technique. Two different phases are observed depending on the deposition temperature (T_S) of the film, leading respectively to an out-of-plane lattice parameter of 0.3846 nm at low temperature (T_S < 600 deg. C) and 0.3941 nm at higher temperatures (T_S > 670 deg. C). Moreover, we find that the field-induced insulator-to-metal transition is correlated to the smaller lattice parameter and, thus, can be directly tuned by changing the deposition temperature of the film. Finally, we conclude that the growth conditions of the film (in particular the deposition temperature) directly influence the substrate-induced strain and, therefore, the transport properties