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AbstractAbstract
[en] XUV interferometry is a unique tool for accurate metrology based on phase modification. X-ray lasers are very bright and short-duration sources that give opportunity to make interferometry of fast-evolving phenomena, such as dense plasmas or surface deformations due to external fields. In particular, picosecond resolution has been obtained by using transient collisional X-ray lasers produced by CPA infrared lasers. (author)
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Japan Atomic Energy Research Inst., Kashiwa, Chiba (Japan); 304 p; Jul 2003; p. 21-24; 4. symposium on advanced photon research; Kizu, Kyoto (Japan); 28-29 Nov 2002; Also available from JAEA; 17 refs., 5 figs.; This record replaces 35019784
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