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AbstractAbstract
[en] We investigate the thermal stability of Mo/SiC multilayer coatings at elevated temperatures. Transmission electron microscopy and x-ray diffraction studies show that, upon annealing, a thermally induced structural relaxation occurs that transforms the polycrystalline Mo and amorphous SiC layers in as-deposited multilayers into an amorphous Mo-Si-C alloy and crystalline SiC, respectively. After this relaxation process is complete, the multilayer is stable at temperatures up to 400 deg. C
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Source
(c) 2005 Optical Society of America; Country of input: International Atomic Energy Agency (IAEA)
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Journal Article
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ALLOYS, CARBIDES, CARBON COMPOUNDS, COHERENT SCATTERING, CRYSTALS, DIFFRACTION, ELECTROMAGNETIC RADIATION, ELECTRON MICROSCOPY, ELEMENTS, FILMS, HEAT TREATMENTS, METALS, MICROSCOPY, PHYSICAL PROPERTIES, RADIATIONS, REFRACTORY METALS, SCATTERING, SILICON COMPOUNDS, TEMPERATURE RANGE, TRANSITION ELEMENT ALLOYS, TRANSITION ELEMENTS, ULTRAVIOLET RADIATION
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