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AbstractAbstract
[en] The InN phase is grown in crystalline InP(100) substrates by 50 keV N+ implantation at an elevated temperature of 400 deg. C followed by annealing at 525 deg. C in N2 ambient. Crystallographic structural and Raman scattering studies are performed for the characterization of grown phases. Temperature- and power-dependent photoluminescence studies show direct band-to-band transition peak ∼1.06 eV at temperatures ≤150 K. Implantations at an elevated temperature with a low ion beam current and subsequent low temperature annealing step are found responsible for the growth of high-quality InN phase
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(c) 2006 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA)
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Journal Article
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