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Endrizzi, M.; Pogorelsky, I.; Gureyev, T.E.; Delogu, P.; Oliva, P.; Golosio, B.; Carpinelli, M.; Yakimenko, Y.; Bottigli, U.
Brookhaven National Laboratory Accelerator Test Facility (United States). Funding organisation: DOE - Office Of Science (United States)2011
Brookhaven National Laboratory Accelerator Test Facility (United States). Funding organisation: DOE - Office Of Science (United States)2011
AbstractAbstract
[en] Quantitative phase retrieval is experimentally demonstrated using the Inverse Compton Scattering X-ray source available at the Accelerator Test Facility (ATF) in the Brookhaven National Laboratory. Phase-contrast images are collected using in-line geometry, with a single X-ray pulse of approximate duration of one picosecond. The projected thickness of homogeneous samples of various polymers is recovered quantitatively from the time-averaged intensity of transmitted X-rays. The data are in good agreement with the expectations showing that ATF Inverse Compton Scattering source is suitable for performing phase-sensitive quantitative X-ray imaging on the picosecond scale. The method shows promise for quantitative imaging of fast dynamic phenomena.
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BNL--95098-2011-JA; AC02-98CH10886
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Journal Article
Journal
Optics Express; ISSN 1094-4087; ; v. 19(3); p. 2748-2753
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