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AbstractAbstract
[en] Lexan polymer films irradiated with 550 keV Electron Beam (EB) were characterized using Wide Angle Xray Scattering (WAXS) data to study the microstructural parameters. The crystal imperfection parameters like crystal size < N>, lattice strain (g in %) and enthalpy (α) have been determined by Line Profile Analysis (LPA) using Fourier method of Warren.
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Source
56. DAE solid state physics symposium 2011; Kattankulathur, Tamilnadu (India); 19-23 Dec 2011; (c) 2012 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA)
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Journal Article
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