[en] Atomic-resolution Z-contrast electron microscopy provides a directly interpretable image showing the location of high-Z atomic columns without the need for any structural models. Usually, the type of column may be identified from its intensity, and the structure and morphology of interfaces, ultrathin films, and superlattices are directly revealed. This has generated many insights into growth and relaxation phenomena. Since the Z-contrast image uses only electrons scattered through large angles, electron energy loss spectroscopy may be performed simultaneously using the transmitted beam, providing information on the local hole concentration from the fine structure of the oxygen-K absorption edge. The resolution achieved is below the coherence length, allowing a microscopic interpretation of transport properties. 7 figs, 14 refs