[en] X-ray fluorescence energy dispersive analysis is applied for the determination of Ta and W in sintering compounds. The combination of selective excitation and very simple mathematical procedures permits the determination of the concentrations of the two adjacent elements (Ta and W) even if the sample contains only few per cent of Ta. Other possible applications are shown. (author)
Journal
Journal of Radioanalytical and Nuclear Chemistry; ISSN 0236-5731; 
; v. 86(4); p. 221-230
; v. 86(4); p. 221-230