[en] Many diagnostic imaging procedures such as nuclear medicine, ultrasound, and computerized tomography (CT) are available to the clinician for the evaluation of liver diseases. No single modality has emerged as the best method for detection of liver pathology. Radionuclide liver-spleen imaging remains an attractive screening procedure. Until recently, only planar radionuclide imaging techniques were available. The introduction of computers and cameras equipped with rotating heads capable of performing SPECT has added new dimension to the diagnostic value in detection of liver pathology. This report describes the authors experience with a such a system and presents three illustrative cases. Two of them had been confirmed surgically, whereas the third had been confirmed histologically by needle biopsy

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[en] Fundamental processes induced in a thick organic system composed of long, well-organized linear molecules by an impact of 5-20 keV C₆₀ are investigated. The organic system is represented by Langmuir-Blodgett multilayers formed from bariated molecules of arachidic acid. The thickness of the system varies between 2 and 16 nm. Coarse-grained molecular dynamics computer simulations are applied to investigate the energy transfer pathways and sputtering yields as a function of the kinetic energy of the projectile and the thickness of the organic overlayer. The results indicate that an impact of keV C₆₀ projectiles leads to significant ejection of organic material. The efficiency of desorption increases with the kinetic energy of the projectile for a given layer thickness. For a constant primary kinetic energy, the sputtering yield goes through a maximum and finally saturates as the LB layer becomes thicker. Such behaviour is caused by a competition between signal enhancement due to increasing number of organic molecules and signal decrease due to lowering of the amount of the primary energy being backreflected into the organic overlayer by the receding organic/metal interface as the layer is getting thicker. When the sample thickness becomes much larger than the penetration depth of the projectile, the sputtering yield is independent of thickness. The deposited energy is channelled by an open and ordered molecular structure, which leads to abnormally long projectile penetration and ion-induced damage.

[en] The ion-stimulated desorption of organic molecules by impact of large and slow clusters is examined using molecular dynamics (MDs) computer simulations. The investigated system, represented by a monolayer of benzene deposited on Ag{1 1 1}, is irradiated with projectiles composed of thousands of noble gas atoms having a kinetic energy of 0.1-20 eV/atom. The sputtering yield of molecular species and the kinetic energy distributions are analyzed and compared to the results obtain for PS4 overlayer. The simulations demonstrate quite clearly that the physics of ejection by large and slow clusters is distinct from the ejection events stimulated by the popular SIMS clusters, like C₆₀, Au₃ and SF₅ at tens of keV energies.

[en] Molecular dynamics computer simulations have been used to investigate the damage of a benzene crystal induced by 5 keV C₂₀, C₆₀, C₁₂₀ and C₁₈₀ fullerene bombardment. The sputtering yield, the mass distributions, and the depth distributions of ejected organic molecules are analyzed as a function of the size of the projectile. The results indicate that all impinging clusters lead to the creation of almost hemispherical craters, and the process of crater formation only slightly depends on the size of the fullerene projectile. The total sputtering yield as well as the efficiency of molecular fragmentation are the largest for 5 keV C₂₀, and decrease with the size of the projectile. Most of the molecules damaged by the projectile impact are ejected into the vacuum during cluster irradiation. Similar behavior does not occur during atomic bombardment where a large portion of fragmented benzene molecules remain inside the crystal after projectile impact. This 'cleaning up' effect may explain why secondary ion mass spectrometry (SIMS) analysis of some organic samples with cluster projectiles can produce significantly less accumulated damage compared to analysis performed with atomic ion beams.

[en] Molecular dynamics computer simulations have been employed to investigate the sputtering process of a benzene (C₆H₆) monolayer deposited on Ag{1 1 1} induced by an impact of slow clusters composed of large number of noble gas atoms. The sputtering yield, surface modifications, and the kinetic energy distributions of ejected species have been analyzed as a function of the cluster size and the binding energy of benzene to the Ag substrate. It is shown that high- and low-energy components can be identified in the kinetic energy distributions of ejected molecules. The mechanistic analysis of calculated trajectories reveals that high-energy molecules are emitted by direct interaction with projectile atoms that are backreflected from the metal substrate. Most of the molecules are ejected by this process. Low-energy molecules are predominantly emitted by a recovering action of the substrate deformed by the impact of a massive cluster. The increase of the binding energy leads to attenuation of both high- and low-energy ejection channels. However, low-energy ejection is particularly sensitive to the variation of this parameter. The area of the molecular overlayer sputtered by the projectile impact is large and increases with the cluster size and the kinetic energy of the projectile. Also the size and the shape of this area are sensitive to the changes of the binding energy. The radius of the sputtered region decreases, and its shape changes from almost circular to a ring-like zone when the binding energy is increased. Some predictions about the perspectives of the application of large clusters in the organic secondary ion mass spectrometry are discussed.

[en] The mechanisms of ion-stimulated desorption of thin organic overlayers deposited on metal substrates by mono- and polyatomic projectiles are examined using molecular dynamics (MD) computer simulations. A monolayer of polystyrene tetramers (PS4) physisorbed on Ag{1 1 1} is irradiated by 15 keV Ga and C₆₀ projectiles at normal incidence. The results are compared with the data obtained for a benzene overlayer to investigate the differences in sputtering mechanisms of weakly and strongly bound organic molecules. The results indicate that the sputtering yield decreases with the increase of the binding energy and the average kinetic energy of parent molecules is shifted toward higher kinetic energy. Although the total sputtering yield of organic material is larger for 15 keV C₆₀, the impact of this projectile leads to a significant fragmentation of ejected species. As a result, the yield of the intact molecules is comparable for C₆₀ and Ga projectiles. Our data indicate that chemical analysis of the very thin organic films performed by detection of sputtered neutrals will not benefit from the use of C₆₀ projectiles