[en] Calculated results are presented which are in good agreement with published M₂, ₃VV Cu (100) ADAS data. The calculations are based on a quasiatomic model where each individual Auger emission is a partial wave of definite (l,m) character, but (l,m) may differ from emission to emission. The (l,m) emission weights have been estimated by fitting the data with a linear combination of calculated intensities for (l,m) up to l = 5. It is found that surprisingly few (l,m) values are necessary to obtain reasonable fits to the data, and the best fits occur for combinations of (l,m) intensities in which the l = 3 waves were most heavily weighted

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[en] It is becoming clear that one of the principal limitations in LEED structure analysis is the quality of the experimental I-V profiles. This limitation is discussed, and data acquisition procedures described, which for simple systems, seem to enhance the quality of agreement between the results of theoretical model calculations and experimental LEED spectra. By employing such procedures to obtain data from Cu(100), excellent agreement between computed and measured profiles has been achieved. 7 figures

[en] Theoretical motivations are reviewed for investigation of multilayer relaxation in relatively simple metallic surfaces. Results from LEED analyses are presented which serve to demonstrate that multilayer relaxation measurably exists in Cu(100) and Cu(110) surfaces. The results from two independent LEED analyses for Cu(110) are shown to be in much better agreement with each other than the LEED results are with multilayer relaxation results obtained by high energy ion scattering. Multilayer relaxation results for other metallic surfaces also are reviewed briefly, and all available results are discussed in relationship to those obtained by a theoretical, model-type, inquiry of Landman, Hill and Mostoller

[en] An equivalent beam averaging (EBA) procedure is described which has proved to be very useful to enhance I-V profile data collected for LEED analyses. Specific analyses are documented where application of EBA has led to improved agreement between calculated and experimental I-V profiles. The procedure also has been substantiated by examination of representative I-V profiles which were calculated to correspond to the incident beam slightly misaligned from, and exactly aligned with, the surface normal. It then has been inferred from such substanstiation that use of EBA in a LEED analysis reduces the effects of systematic experimental errors caused by minor misalignment of the incident beam, beam divergence, and certain surface morphologies

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