AbstractAbstract
[en] The surface morphology of YBa2Cu3O7-δ (YBCO) films is crucial for applications such as multilayering and optical detection. In this article, we showed that the resputtering effect due to the rf plasma can planarize the surface morphology of YBCO films under specific conditions. By setting the relative position and angle of the heater to the gun, the plasma density over the substrate can be altered from an asymmetric to a symmetric distribution. When the substrate was near the plasma, the negative oxygen ions resputtered part of the mobile atoms from the surface of the film back into the plasma, which caused compositional distortion, delaying the merge of grains and leaving uncovered holes. With a longer distance, the resputtering effect was suppressed, and precipitates appeared on the surface of films, resulting in a rougher surface. At an optimum heater-to-gun configuration, the function of the resputtering effect produced a polishing effect on the surface of films, which made a smooth and precipitate-free YBCO film possible. We also found that this film with smooth and precipitate-free morphology exhibited suppressed superconductivity, Tc0 and Ton
Secondary Subject
Source
(c) 2002 American Vacuum Society.; Country of input: International Atomic Energy Agency (IAEA)
Record Type
Journal Article
Journal
Journal of Vacuum Science and Technology. A, Vacuum, Surfaces and Films; ISSN 0734-2101; ; CODEN JVTAD6; v. 20(2); p. 441-446
Country of publication
Reference NumberReference Number
INIS VolumeINIS Volume
INIS IssueINIS Issue
External URLExternal URL
AbstractAbstract
[en] La0.7Ca0.3MnO3 thin films grown on SrTiO3 (100) substrates by off-axis sputtering technique exhibit a fully strained film when the thickness of films is thinner than 25 nm. Transport and magnetic properties of the films for the magnetic field applied parallel to the surface of the films were consistent and could be easily explained by the domain-rotation model. However, these properties were not consistent when the field applied perpendicular to the substrate. The critical field for which peak resistivity was observed in the magnetoresistance measurement, H c'(-perpendicular ) ∼ 79,500 A m-1, one order of magnitude higher than the coercive field, H c perpendicular ∼ 7950 A m-1. The peak width of the in-plane X-ray diffraction peak (200) of the films as measured by a five-axis X-ray diffractometer showed an exponential decrease to the thickness of films. This broadening cannot be explained by the strain effect alone. We found that nanostructures, such as the ferromagnetic phase segregation in the paramagnetic matrix or the columnar structure in films that introduced excess domain walls, could be responsible for the inconsistency between H c' perpendicular and H c perpendicular
Primary Subject
Source
S0040-6090(06)00902-3; Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA)
Record Type
Journal Article
Journal
Country of publication
ANISOTROPY, CALCIUM COMPOUNDS, CRITICAL FIELD, FERROELECTRIC MATERIALS, LANTHANUM COMPOUNDS, MAGNETIC PROPERTIES, MAGNETORESISTANCE, MANGANESE COMPOUNDS, NANOSTRUCTURES, OXIDES, PARAMAGNETISM, SEGREGATION, SPUTTERING, STRAINS, STRONTIUM TITANATES, THIN FILMS, X-RAY DIFFRACTION, X-RAY DIFFRACTOMETERS
ALKALINE EARTH METAL COMPOUNDS, CHALCOGENIDES, COHERENT SCATTERING, DIELECTRIC MATERIALS, DIFFRACTION, DIFFRACTOMETERS, ELECTRIC CONDUCTIVITY, ELECTRICAL PROPERTIES, FILMS, MAGNETIC FIELDS, MAGNETISM, MATERIALS, MEASURING INSTRUMENTS, OXYGEN COMPOUNDS, PHYSICAL PROPERTIES, RARE EARTH COMPOUNDS, SCATTERING, STRONTIUM COMPOUNDS, TITANATES, TITANIUM COMPOUNDS, TRANSITION ELEMENT COMPOUNDS
Reference NumberReference Number
INIS VolumeINIS Volume
INIS IssueINIS Issue
External URLExternal URL