Bowman, Stephen M.; Horwedel, James E.
ICNC2003: Proceedings of the seventh international conference on nuclear criticality safety. Challenges in the pursuit of global nuclear criticality safety2003
ICNC2003: Proceedings of the seventh international conference on nuclear criticality safety. Challenges in the pursuit of global nuclear criticality safety2003
AbstractAbstract
[en] The SCALE (Standardized Computer Analyses for Licensing Evaluation) computer software system developed at Oak Ridge National Laboratory is widely used and accepted around the world for criticality safety analyses. SCALE includes the well-known KENO V.a and KENO-VI three-dimensional (3-D) Monte Carlo criticality computer codes. One of the current development efforts aimed at making SCALE easier to use is the SCALE Graphically Enhanced Editing Wizard (GeeWiz). GeeWiz is compatible with SCALE 5 and runs on Windows personal computers. GeeWiz provides input menus and context-sensitive help to guide users through the setup of their input. It includes a direct link to KENO3D to allow the user to view the components of their geometry model as it is constructed. Once the input is complete, the user can click a button to run SCALE and another button to view the output. KENO3D has also been upgraded for compatibility with SCALE 5 and interfaces directly with GeeWiz. GeeWiz and KENO3D for SCALE 5 are planned for release in late 2003. The presentation of this paper is designed as a live demonstration of GeeWiz and KENO3D for SCALE 5. (author)
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Japan Atomic Energy Research Inst., Kashiwa, Chiba (Japan); 486 p; Oct 2003; p. 516-522; ICNC2003: 7. international conference on nuclear criticality safety. Challenges in the pursuit of global nuclear criticality safety; Tokai, Ibaraki (Japan); 20-24 Oct 2003; Also available from JAEA; 2 refs., 8 figs.; This record replaces 35060885
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Bowman, Stephen M.; Rearden, Bradley T.; Horwedel, James E.
Oak Ridge National Laboratory (United States). Funding organisation: NNSA USDOE - National Nuclear Security Administration (NNSA) (United States)2007
Oak Ridge National Laboratory (United States). Funding organisation: NNSA USDOE - National Nuclear Security Administration (NNSA) (United States)2007
AbstractAbstract
[en] The KENO V.a and KENO-VI three-dimensional Monte Carlo criticality computer codes in the SCALE (Standardized Computer Analyses for Licensing Evaluation) computer software system developed at Oak Ridge National Laboratory (ORNL) are widely used and accepted around the world for criticality safety analyses. As part of current development efforts to improve SCALE's ease of use, the SCALE project team at ORNL has developed a new integrated graphical visualization package for KENO V.a and KENO-VI in SCALE 5.1. This package uses the SCALE Graphically Enhanced Editing Wizard (GeeWiz) as the visualization control center that provides users the capability to set up, execute, plot, and view results from KENO in a friendly, colorful, and interactive computing environment without ever using a text editor or a command prompt
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1 May 2007; 5 p; 8. International Conference on Nuclear Criticality Safety; St. Petersburg (Russian Federation); 28 May - 1 Jun 2007; ORNL/PTS--6041; DP0902090; DPDP097; AC05-00OR22725; Available from Oak Ridge National Laboratory, Oak Ridge, TN (US); 12-16
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Bowman, Stephen M.; DeHart, Mark D; Dunn, Michael E.; Goluoglu, Sedat; Horwedel, James E.; Petrie Jr, Lester M.; Rearden, Bradley T; Williams, Mark L.
Oak Ridge National Laboratory (United States). Funding organisation: NNSA USDOE - National Nuclear Security Administration (NNSA) (United States)2007
Oak Ridge National Laboratory (United States). Funding organisation: NNSA USDOE - National Nuclear Security Administration (NNSA) (United States)2007
AbstractAbstract
[en] Version 5.1 of the SCALE computer software system developed at Oak Ridge National Laboratory, released in 2006, contains several significant enhancements for nuclear criticality safety analysis. This paper highlights new capabilities in SCALE 5.1, including improved resonance self-shielding capabilities; ENDF/B-VI.7 cross-section and covariance data libraries; HTML output for KENO V.a; analytical calculations of KENO-VI volumes with GeeWiz/KENO3D; new CENTRMST/PMCST modules for processing ENDF/B-VI data in TSUNAMI; SCALE Generalized Geometry Package in NEWT; KENO Monte Carlo depletion in TRITON; and plotting of cross-section and covariance data in Javapeno
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1 May 2007; 5 p; 8. International Conference on Nuclear Criticality Safety; St. Petersburg (Russian Federation); 28 May - 1 Jun 2007; ORNL/PTS--6040; DP0902090; DPDP097; AC05-00OR22725; Available from Oak Ridge National Laboratory, Oak Ridge, TN (US); pages 403-407
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