[en] In many of the recent e⁺e^- particle physics experiments, monitoring of the accumulated dose in silicon is essential to maximize the lifetime of silicon vertex detectors operating in severe radiation environments. Using radiation-sensing field-effect transistors (RadFET) as radiation monitoring devices, we studied their responses during irradiation and during subsequent annealing. The relation between the RadFET response and the dose was determined by irradiations with a ⁶⁰Co source with known activity. The study of annealing at three different temperatures showed that RadFETs gradually anneal for up to 40%. Annealing can be fitted by a sum of two exponential functions with time constants of 3 and 85 days

[en] Over the last few years great progress has been made in the technological development of Monolithic Active Pixel Sensors (MAPS) such that upgrades to existing vertex detectors using this technology are now actively being considered. Future vertex detection at an upgraded KEK-B factory, already the highest luminosity collider in the world, will require a detector technology capable of withstanding the increased track densities and larger radiation exposures. Near the beam pipe the current silicon strip detectors have projected occupancies in excess of 100%. Deep sub-micron MAPS look very promising to address this problem. In the context of an upgrade to the Belle vertex detector, the major obstacles to realizing such a device have been concerns about radiation hardness and readout speed. Two prototypes implemented in the TSMC 0.35 μm process have been developed to address these issues. Denoted the Continuous Acquisition Pixel, or CAP, the two variants of this architecture are distinguished in that CAP2 includes an 8-deep sampling pipeline within each 22.5 μm² pixel. Preliminary test results and remaining R and D issues are presented