[en] Amorphous C and Si films were sputter-deposited as underlayers of Co/Pd multilayer perpendicular magnetic recording media. The magnetic properties of the media were significantly affected by the underlayer thickness; namely, the values of coercivity H_c and nucleation field -H_n increased and the value of α decreased with merely increasing the thickness of C or Si underlayer, where α is the derivative of M-H loop at the value of coercivity. The coercivity was not always affected by magnetic anisotropy constant K_u for the Co/Pd media. In read-write experiments, the higher S/N ratio was obtained for the media with the thicker C or Si underlayer, which exhibited low α and high H_c. In the time decay experiments of magnetization, the Co/Pd multilayer media with C or Si underlayer possessed good thermal stability. This study demonstrated that the introduction of C or Si underlayer greatly improves magnetic properties, read-write characteristics, and thermal stability of Co/Pd multilayer perpendicular magnetic recording media

[en] The effect of amorphous carbon underlayer thickness on the microstructure of the Co/Pd multilayer perpendicular magnetic recording media was investigated. From the magnetic force microscopy observation in the AC-demagnetized state of the Co/Pd multilayer media, the magnetic cluster size was observed to effectively decrease with an increase in carbon underlayer thickness, where the higher coercivity and the higher S/N ratio of the Co/Pd multilayer media were obtained with the thicker underlayer. Furthermore, the distribution of [1 1 1] orientation of FCC-Pd became broader, and the grain size decreased with an increase in the carbon underlayer thickness. These effects caused the magnetic exchange decoupling of Co/Pd multilayer media. We suggested that the change of microstructure was directly related to the surface roughness of the amorphous carbon underlayer

[en] Signal and noise characteristics of Co/Pd multilayer perpendicular magnetic recording media are discussed based upon MFM analysis. The noise of the Co/Pd multilayer media is originated mainly from irregularities in the magnetic transition regions, and can be drastically suppressed by increasing the thickness of the carbon underlayer although a large number of reversed magnetic domains between the magnetic transitions still exist. The fine magnetic clusters formed in the medium with a thick carbon underlayer result in clear magnetic transition boundaries of recorded bits in the high recording density region. By examining the profile of the M-H loops, the decrement in the α value, which is defined as the slope of M-H loop at the value of coercivity, improves the signal to noise (S/N) ratio for the Co/Pd multilayer media

[en] Effects of the introduction of a Pd/Si dual seedlayer on the microcrystalline structure and magnetic properties of [Co/Pd]_n multilayered perpendicular magnetic recording media were investigated. The Pd/Si dual seedlayer was composed of a Pd upper seedlayer and a Si under seedlayer. The Pd upper seedlayer with a thickness of up to 10 nm markedly increased the coercivity of [Co/Pd]_n multilayered media in the direction perpendicular to the film surface. The highest coercivity of 7.8 kOe was obtained for the [Co/Pd]₁₀ medium with a Pd (10 nm)/Si (100 nm) dual seedlayer. The Pd upper seedlayer not only facilitated the formation of regular interfaces between the Co and Pd layers, but also reduced the thickness of the deteriorated initial layer in the [Co/Pd]_n multilayer, resulting in enhancement of the magnetic anisotropy field. The [Co/Pd]_n multilayered medium with the Pd/Si dual seedlayer exhibited weak intergranular exchange coupling between [Co/Pd]_n grains, which led to excellent read-write characteristics

[en] Electroless deposition process for fabricating magnetic dot arrays was studied. A patterned Si substrate with a SiO₂ resist was produced by processes combined with electron-beam lithography and reactive ion etching. By immersing the patterned Si substrate into a CoNiP electroless deposition bath, CoNiP was deposited only into the patterned pores, demonstrating a satisfactory area selectivity of the deposition. Excellent uniformity on the CoNiP deposition into the patterned pores with diameter less than 100 nm and high aspect ratio (>5) was achieved by applying chemical activation processes using a Pd solution prior to the deposition. The CoNiP dot arrays exhibited higher perpendicular squareness ratio than that of CoNiP continuous film and showed a clear magnetization state at DC-magnetized state, which originated from the shape anisotropy caused by high aspect ratio of the dot patterns

[en] The soft x-ray absorption and magnetic circular dichroism spectra at the Co L_2,3-edges of [Co/Pd]₂₀ and [CoB/Pd]₂₀ multilayered films, which were sputter-deposited in Ar gas containing N₂ at room temperature, were measured to investigate the electronic and spin states of the films. The macroscopic magnetic properties, such as coercivity and saturation magnetization, and microstructural properties, such as grain size and preferred orientation, were markedly changed for the [Co/Pd]₂₀ film by the B doping and N₂ addition. The B doping and/or the addition of N₂ gas caused appreciable changes not only in macroscopic magnetic properties but also in microscopic properties, such as the spin angular momentum and orbital angular momentum, throughout the multilayered film. On the other hand, a new spectral feature at the high energy side of the Co L₃-edge peak in x-ray absorption spectra was found in only the films with N₂ added. Thus, the microscopic properties, such as electronic and spin states, of the Co 3d electronic state for the [Co/Pd]₂₀ and [CoB/Pd]₂₀ films were changed by only the sputtering process with additive N₂ gas

[en] A novel fabrication process of a soft magnetic underlayer (SUL) for a double-layered perpendicular magnetic recording medium was presented. The CoNiFeB SUL was deposited on a silicon disk substrate using an electroless deposition. The Ni seed layer for the electroless deposition was prepared by an electrochemical process. The surface of the deposited SUL was subjected to a chemical mechanical polishing to be flattened, and R_a value of the SUL was less than 0.4 nm. A magnetic domain structure greatly depended on the electroless deposition condition. Particularly, the control of an agitation speed during electroless deposition is much effective for the suppression of distinct domain walls appearing in CoNiFeB underlayers

[en] A 10 nm Pd/Si dual thin film was developed as a seed layer for a Co/Pd multilayer in double-layered perpendicular magnetic recording media. The Pd/Si seed layer, sputter deposited under Ar sputtering gas containing N₂ and postannealed at 400 deg. C, markedly reduced intergranular exchange coupling of the Co/Pd multilayered film, resulting in a decrease in both the slope parameter, defined as 4π(dM/dH)_H=Hc, and the magnetic cluster size. Consequently, medium noise was essentially reduced, thereby improving the signal-to-noise ratio of the Co/Pd recording media on a CoZrNb soft magnetic underlayer. The addition of N₂ gas effectively decreased the grain size of Pd in the seed layer. A Pd/Si seed layer prepared with both processes exhibited a granular structure of fine Pd-rich grains surrounded by a Si-rich amorphous region, which provided nucleation sites for the growth of well-separated Co/Pd multilayered grains